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MFRC522 数据表(PDF) 80 Page - NXP Semiconductors

部件名 MFRC522
功能描述  Contactless reader IC
PDF  96 Pages
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制造商  NXP [NXP Semiconductors]
网页  http://www.nxp.com
标志 NXP - NXP Semiconductors

MFRC522 数据表(HTML) 80 Page - NXP Semiconductors

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MFRC522_33
© NXP B.V. 2009. All rights reserved.
Product data sheet
PUBLIC
Rev. 3 — 26 October 2009
112133
80 of 96
NXP Semiconductors
MFRC522
Contactless reader IC
16.1.3 Test signals on pins AUX1 or AUX2
The MFRC522 allows the user to select internal signals for measurement on pins AUX1 or
AUX2. These measurements can be helpful during the design-in phase to optimize the
design or used for test purposes.
Table 158 shows the signals that can be switched to pin AUX1 or AUX2 by setting
AnalogSelAux1[3:0] or AnalogSelAux2[3:0] in the AnalogTestReg register.
Remark: The DAC has a current output, therefore it is recommended that a 1 k
Ω
pull-down resistor is connected to pin AUX1 or AUX2.
Table 156. Test bus signals: TestBusSel[4:0] = 07h
Pins
Internal
signal name
Description
D6
s_data
received data stream
D5
s_coll
bit-collision detected (106 kBd only)
D4
s_valid
s_data and s_coll signals are valid
D3
s_over
receiver has detected a stop condition
D2
RCV_reset
receiver is reset
D1
-
reserved
Table 157. Test bus signals: TestBusSel[4:0] = 0Dh
Pins
Internal test
signal name
Description
D6
clkstable
oscillator output signal
D5
clk27/8
oscillator output signal divided by 8
D4 to D3
-
reserved
D2
clk27
oscillator output signal
D1
-
reserved
Table 158. Test signal descriptions
AnalogSelAux1[3:0]
or
AnalogSelAux2[3:0]
value
Signal on pin AUX1 or pin AUX2
0000
3-state
0001
DAC: register TestDAC1 or TestDAC2
0010
DAC: test signal Corr1
0011
reserved
0100
DAC: test signal MinLevel
0101
DAC: test signal ADC_I
0110
DAC: test signal ADC_Q
0111 to 1001
reserved
1010
HIGH
1011
LOW
1100
TxActive



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