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MFRC522 数据表(PDF) 79 Page - NXP Semiconductors |
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MFRC522 数据表(HTML) 79 Page - NXP Semiconductors |
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79 / 96 page ![]() MFRC522_33 © NXP B.V. 2009. All rights reserved. Product data sheet PUBLIC Rev. 3 — 26 October 2009 112133 79 of 96 NXP Semiconductors MFRC522 Contactless reader IC 16. Test information 16.1 Test signals 16.1.1 Self test The MFRC522 has the capability to perform a digital self test. The self test is started by using the following procedure: 1. Perform a soft reset. 2. Clear the internal buffer by writing 25 bytes of 00h and implement the Config command. 3. Enable the self test by writing 09h to the AutoTestReg register. 4. Write 00h to the FIFO buffer. 5. Start the self test with the CalcCRC command. 6. The self test is initiated. 7. When the self test has completed, the FIFO buffer contains the following 64 bytes: FIFO buffer byte values for version 90h: 00h, 87h, 98h, 0fh, 49h, FFh, 07h, 19h BFh, 22h, 30h, 49h, 59h, 63h, ADh, CAh 7Fh, E3h, 4Eh, 03h, 5Ch, 4Eh, 49h, 50h 47h, 9Ah, 37h, 61h, E7h, E2h, C6h, 2Eh 75h, 5Ah, EDh, 04h, 3Dh, 02h, 4Bh, 78h 32h, FFh, 58h, 3Bh, 7Ch, E9h, 00h, 94h B4h, 4Ah, 59h, 5Bh, FDh, U9h, 29h, DFh 35h, 96h, 98h, 9Eh, 4Fh, 30h, 32h, 8Dh FIFO buffer byte values for version 91h: 00h, C6h, 37h, D5h, 32h, B7h, 57h, 5Ch C2h, D8h, 7Ch, 4Dh, D9h, 70h, C7h, 73h 10h, E6h, D2h, AAh, 5Eh, A1h, 3Eh, 5Ah 14h, AFh, 30h, 61h, C9h, 70h, DBh, 2Eh 64h, 22h, 72h, B5h, BDh, 65h, F4h, ECh 22h, BCh, D3h, 72h, 35h, CDh, AAh, 41h 1Fh, A7h, F3h, 53h, 14h, DEh, 7Eh, 02h D9h, 0Fh, B5h, 5Eh, 25h, 1Dh, 29h, 79h 16.1.2 Test bus The test bus is used for production tests. The following configuration can be used to improve the design of a system using the MFRC522. The test bus allows internal signals to be routed to the digital interface. The test bus comprises two sets of test signals which are selected using their subaddress specified in the TestSel2Reg register’s TestBusSel[4:0] bits. The test signals and their related digital output pins are described in Table 156 and Table 157. |
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