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MFRC522 数据表(PDF) 63 Page - NXP Semiconductors

部件名 MFRC522
功能描述  Contactless reader IC
PDF  96 Pages
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制造商  NXP [NXP Semiconductors]
网页  http://www.nxp.com
标志 NXP - NXP Semiconductors

MFRC522 数据表(HTML) 63 Page - NXP Semiconductors

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MFRC522_33
© NXP B.V. 2009. All rights reserved.
Product data sheet
PUBLIC
Rev. 3 — 26 October 2009
112133
63 of 96
NXP Semiconductors
MFRC522
Contactless reader IC
9.3.4.8
VersionReg register
Shows the MFRC522 software version.
9.3.4.9
AnalogTestReg register
Determines the analog output test signal at, and status of, pins AUX1 and AUX2.
Table 130. AutoTestReg register bit descriptions
Bit
Symbol
Value Description
7
reserved
-
reserved for production tests
6
AmpRcv
1
internal signal processing in the receiver chain is performed
non-linearly which increases the operating distance in communication
modes at 106 kBd
Remark: due to non-linearity, the effect of the RxThresholdReg
register’s MinLevel[3:0] and the CollLevel[2:0] values is also
non-linear
5 to 4
RFT
-
reserved for production tests
3 to 0
SelfTest
[3:0]
-
enables the digital self test
the self test can also be started by the CalcCRC command; see
Section 10.3.1.4 on page 68
the self test is enabled by 1001b
Remark: for default operation the self test must be disabled by 0000b
Table 131. VersionReg register (address 37h); reset value: xxh bit allocation
Bit
7
6
5
4
3
2
1
0
Symbol
Version[7:0]
Access
R
Table 132. VersionReg register bit descriptions
Bit
Symbol
Description
7 to 0
Version[7:0]
indicates current software version of the MFRC522
Remark: the current version of the MFRC522 is 90h or 91h
Table 133. AnalogTestReg register (address 38h); reset value: 00h bit allocation
Bit
7
6
5
4
3
2
1
0
Symbol
AnalogSelAux1[3:0]
AnalogSelAux2[3:0]
Access
R/W
R/W



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