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AM79C978VC/W 数据表(PDF) 227 Page - Advanced Micro Devices |
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AM79C978VC/W 数据表(HTML) 227 Page - Advanced Micro Devices |
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227 / 261 page ![]() Am79C978 227 SWITCHING CHARACTERISTICS: MEDIA INDEPENDENT INTERFACE Notes: 1. MDIO valid measured at the exposed mechanical Media Independent Interface. 2. TXCLK and RXCLK frequency and timing parameters are defined for the external physical layer transceiver as defined in the IEEE 802.3u standard. They are not replicated here. Parameter Symbol Parameter Name Test Condition Min Max Unit Transmit Timing tTVAL TX_EN and TXD valid from ↑ TX_CLK measured from Vilmax = 0.8 V or measured from Vihmin = 2.0V (Note 1) 0 25 ns Receive Timing tRSU RX_DV, RX_ER, RXD setup to ↑ RX_CLK measured from Vilmax = 0.8 V or measured from Vihmin = 2.0V (Note 1) 10 ns tRH RX_DV, RX_ER, RXD hold to ↑ RX_CLK measured from Vilmax = 0.8 V or measured from Vihmin = 2.0V (Note 1) 10 ns Management Cycle Timing tMHIGH MDC Pulse Width HIGH Time CLOAD = 390 pf 160 ns tMLOW MDC Pulse Width LOW Time CLOAD = 390 pf 160 ns tMCYC MDC Cycle Period CLOAD = 390 pf 400 ns tMSU MDIO setup to ↑ MDC CLOAD = 470 pf, measured from Vilmax = 0.8 V or measured from Vihmin = 2.0V (Note 1) 10 ns tMH MDIO hold to ↑ MDC CLOAD = 470 pf, measured from Vilmax = 0.8 V or measured from Vihmin = 2.0V (Note 1) 10 ns tMVAL MDIO valid from ↑ MDC CLOAD = 470 pf, measured from Vilmax = 0.8 V or measured from Vihmin = 2.0V, (Note 1) tMCYC - tMSU ns |
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