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AM79C978VC/W 数据表(PDF) 92 Page - Advanced Micro Devices |
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AM79C978VC/W 数据表(HTML) 92 Page - Advanced Micro Devices |
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92 / 261 page ![]() 92 Am79C978 NAND Tree Testing The controller provides a NAND tree test mode to allow checking connectivity to the device on a printed circuit board. The NAND tree is built on all PCI bus pins. NAND tree testing is enabled by asserting RST. PG input should be driven HIGH during NAND tree testing. All PCI bus signals will become inputs on the assertion of RST. The result of the NAND tree test can be ob- served on the INTA pin. See Figure 48. Pin 141 (RST) is the first input to the NAND tree. Pin 142 (CLK) is the second input to the NAND tree, fol- lowed by pin 143 (GNT). All other PCI bus signals fol- low, counterclockwise, with pin 61 (AD0) being the last. Table 21 and Table 22 shows the complete list of pins connected to the NAND tree. RST must be asserted low to start a NAND tree test se- quence. Initially, all NAND tree inputs except RST should be driven high. This will result in a high output at the INTA pin. If the NAND tree inputs are driven from high to low in the same order as they are connected to build the NAND tree, INTA will toggle every time an ad- ditional input is driven low. INTA will change to low, when CLK is driven low and all other NAND tree inputs stay high. INTA will toggle back to high, when GNT is additionally driven low. The square wave will continue until all NAND tree inputs are driven low. INTA will be high, when all NAND tree inputs are driven low. See Figure 49. Some of the pins connected to the NAND tree are out- puts in normal mode of operation. They must not be driven from an external source until the controller is configured for NAND tree testing. Figure 48. NAND Tree Circuitry (160 PQFP) Am79C972 Core RST (pin141) CLK (pin 142) VDD GNT (pin 143) AD0 (pin 61) INTA (pin 140) B A S MUX O .... INTA Am79C978 Core 22206B-52 |
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