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AD4052BCPZ-R2 数据表(PDF) 17 Page - Analog Devices

部件名 AD4052BCPZ-R2
功能描述  Compact, Low Power, 16-Bit, 2 MSPS/500 kSPS Easy Drive SAR ADC
PDF  66 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

AD4052BCPZ-R2 数据表(HTML) 17 Page - Analog Devices

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Data Sheet
AD4052/AD4058
TERMINOLOGY
analog.com
Rev. B | 17 of 66
Integral Nonlinearity (INL) Error
INL is the deviation of each individual code from a line drawn from
the negative full scale through the positive full scale. The point
used as the negative full scale occurs ½ LSB before the first code
transition. The positive full scale is defined as a level 1½ LSB
beyond the last code transition. The deviation is measured from
each code center to the true straight line.
Differential Nonlinearity (DNL) Error
In an ideal ADC, code transitions are 1 LSB apart. DNL is the
maximum deviation from this ideal value. DNL is often specified in
terms of resolution for which no missing codes are guaranteed.
Zero Error (ZE)
Zero error is the difference between the ideal midscale voltage, 0 V,
and the actual voltage producing the midscale output code, 0 LSB.
Gain Error (GE)
The first transition (from 100 ... 00 to 100 ... 01) occurs at a level
½ LSB above the nominal negative full scale. The last transition
(from 011 … 10 to 011 … 11) occurs for an analog voltage 1½ LSB
below the nominal full scale. The gain error is the deviation of the
difference between the actual level of the last transition and the
actual level of the first transition from the difference between the
ideal levels.
Total Unadjusted Error (TUE)
TUE is the worst-case measured deviation from the ideal ADC
transfer function over the full input range, specified in ppm of
full-scale. TUE includes the combined effects of zero error, gain
error, and INL error for any given device.
Dynamic Range (DR)
Dynamic range is the RMS voltage of a full-scale sine wave to the
total RMS voltage of the noise measured. The value for dynamic
range is expressed in decibels. Dynamic range is measured with a
signal at −60 dBFS so that it includes all noise sources and DNL
artifacts.
Spurious-Free Dynamic Range (SFDR)
SFDR is the difference, in decibels (dB), between the RMS ampli-
tude of a full-scale input signal and the peak spurious signal.
Signal-to-Noise Ratio (SNR)
SNR is the ratio of the RMS voltage of a full-scale sine wave to
the RMS sum of all other spectral components below the Nyquist
frequency, excluding harmonics and DC. The value for SNR is
expressed in decibels.
Total Harmonic Distortion (THD)
THD is the ratio of the RMS sum of the first five harmonic compo-
nents to the RMS value of a full-scale input signal and is expressed
in decibels.
Signal-to-Noise-and-Distortion (SINAD) Ratio
SINAD is the ratio of the RMS voltage of a full-scale sine wave to
the RMS sum of all other spectral components that are less than
the Nyquist frequency, including harmonics but excluding DC. The
value of SINAD is expressed in decibels.
Effective Number of Bits (ENOB)
ENOB is a measurement of the resolution with a sine wave input.
ENOB is related to SINAD as follows:
ENOB = (SINAD dB − 1.76)/6.02.
ENOB is expressed in bits.
Common-Mode Rejection Ratio (CMRR)
CMRR is the ratio of the power in the ADC output at the frequency,
f, to the power of a −1 dBFS sine wave applied to the input
common-mode voltage of frequency, f.
CMRRdB =10×logPADC_IN/PADC_OUT
where:
PADC_IN is the common-mode power at the frequency, f, applied to
the inputs.
PADC_OUT is the power at the frequency, f, in the ADC output.
Aperture Delay
Aperture delay is the time between the rising edge of the CNV input
and when the input signal is held for a conversion.



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