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ADP1046AACPZ-R7 数据表(PDF) 8 Page - Analog Devices |
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ADP1046AACPZ-R7 数据表(HTML) 8 Page - Analog Devices |
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8 / 88 page  ADP1046A Data Sheet Rev. 0 | Page 8 of 88 Parameter Symbol Test Conditions/Comments Min Typ Max Unit EEPROM RELIABILITY Endurance1 T J = 85°C 10,000 Cycles T J = 125°C 1000 Cycles Data Retention2 T J = 85°C 20 Years T J = 125°C 10 Years 1 Endurance is qualified as per JEDEC Standard 22, Method A117, and is measured at −40°C, +25°C, +85°C, and +125°C. Endurance conditions are subject to change pending EEPROM qualification. 2 Retention lifetime equivalent at junction temperature (T J) = 85°C as per JEDEC Standard 22, Method A117. The derated retention lifetime equivalent at junction temperature TJ = 125°C is 2.87 years and is subject to change pending EEPROM qualification. Timing Diagram SCL SDA P S tBUF tHD;STA tHD;DAT tHIGH tSU;DAT tHD;STA tSU;STA tSU;STO tLOW tR tF S P Figure 2. Serial Bus Timing Diagram |
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