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AR0330 数据表(PDF) 21 Page - ON Semiconductor |
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AR0330 数据表(HTML) 21 Page - ON Semiconductor |
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21 / 77 page ![]() AR0330_DS Rev. U Pub. 4/15 EN 21 ©Semiconductor Components Industries, LLC,2015. AR0330: 1/3-Inch CMOS Digital Image Sensor Electrical Characteristics 4. A device must internally provide a hold time of at least 300 ns for the SDATA signal to bridge the undefined region of the falling edge of SCLK. 5. The maximum tHD;DAT has only to be met if the device does not stretch the LOW period (tLOW) of the SCLK signal. 6. A Fast-mode I2C-bus device can be used in a Standard-mode I2C-bus system, but the requirement tSU;DAT 250 ns must then be met. This will automatically be the case if the device does not stretch the LOW period of the SCLK signal. If such a device does stretch the LOW period of the SCLK signal, it must output the next data bit to the SDATA line tr max + tSU;DAT = 1000 + 250 = 1250 ns (according to the Standard-mode I2C-bus specification) before the SCLK line is released. 7. Cb = total capacitance of one bus line in pF. Figure 9: I/O Timing Diagram (Parallel Mode) Table 15: I/O Parameters fEXTCLK = 24 MHz; VDD = 1.8V; VAA = 2.8V; VAA_PIX = 2.8V; VDD_PLL = 2.8V; Output load = 68.5pF; T J = 60°C; CLK_OP = 98 MPixel/s Symbol Definition Conditions Min Max Units VIH Input HIGH voltage VDD_IO = 1.8V 1.4 VDD_IO + 0.3 V VDD_IO = 2.8V 2.4 VIL Input LOW voltage VDD_IO = 1.8V GND – 0.3 0.4 VDD_IO = 2.8V GND – 0.3 0.8 IIN Input leakage current No pull-up resistor; VIN = VDD OR DGND – 20 20 A VOH Output HIGH voltage At specified IOH VDD_IO - 0.4V – V VOL Output LOW voltage At specified IOL –0.4 V IOH Output HIGH current At specified VOH ––12 mA IOL Output LOW current At specified VOL –9 mA IOZ Tri-state output leakage current – 10 A Data[11:0] FRAME_VALID/ LINE_VALID FRAME_VALID leads LINE_VALID by 609 PIXCLKs. FRAME_VALID trails LINE_VALID by 16 PIXCLKs. PIXCLK *PLL disabled for tCP EXTCLK tCP tR tEXTCLK tF tRP tFP tPD tPD tPFH tPLH tPFL tPLL Pxl _0 Pxl _1 Pxl _2 Pxl _n 90% 10% 90% 10% |
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