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EDBA164B4PR-1DATF-R 数据表(PDF) 106 Page - Micron Technology |
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EDBA164B4PR-1DATF-R 数据表(HTML) 106 Page - Micron Technology |
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106 / 152 page ![]() Table 64: IDD Specification Parameters and Operating Conditions (Continued) Notes 1–3 apply to all parameters and conditions Parameter/Condition Symbol Power Supply Notes Deep power-down current: CK_t = LOW, CK_c = HIGH; CKE is LOW; CA bus inputs are stable; Data bus inputs are stable IDD81 VDD1 7 IDD82 VDD2 7 IDD8IN VDDQ 4, 7 Notes: 1. IDD values are the maximum of the distribution of the arithmetic mean. 2. IDD current specifications are tested after the device is properly initialized. 3. The 1x self refresh rate is the rate at which the device is refreshed internally during self refresh before going into the extended temperature range. 4. Measured currents are the sum of VDDQ and VDD2. 5. Per-bank REFRESH is only applicable for LPDDR2-S4 device densities 1Gb or higher. 6. This is the general definition that applies to full-array self refresh. Refer to "IDD6 Full and Partial Array Self-Refresh Current" for details of Partial Array Self Refresh IDD6 specification. 7. IDD6ET and IDD8 are typical values, sampled only and not tested. AC and DC Operating Conditions An operation or timing that is not specified is illegal. To ensure proper operation, the device must be initialized properly. Table 65: Recommended DC Operating Conditions Symbol LPDDR2-S4B Power Supply Unit Min Typ Max VDD11 1.70 1.80 1.95 Core power 1 V VDD2 1.14 1.20 1.30 Core power 2 V VDDQ 1.14 1.20 1.30 I/O buffer power V Note: 1. VDD1 uses significantly less power than VDD2. Table 66: Input Leakage Current Parameter/Condition Symbol Min Max Unit Notes Input leakage current: For CA, CKE, CS_n, CK_t, CK_c; Any input 0V ≤ VIN ≤ VDD2; (All other pins not under test = 0V) IL –2 2 μA1 VREF supply leakage current: VREFDQ = VDDQ/2, or VREFCA = VDD2/2; (All other pins not under test = 0V) IVREF –1 1 μA2 Notes: 1. Although DM is for input only, the DM leakage must match the DQ and DQS_t/DQS_c output leakage specification. 2. The minimum limit requirement is for testing purposes. The leakage current on VREFCA and VREFDQ pins should be minimal. 216-Ball and 220-Ball, Dual-Channel LPDDR2 SDRAM AC and DC Operating Conditions 09005aef85eb530a 216b_220b_2ch_2e0e_embedded_lpddr2.pdf – Rev. F 08 /16 EN 106 Micron Technology, Inc. reserves the right to change products or specifications without notice. © 2014 Micron Technology, Inc. All rights reserved. |
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