ENC28J60-CSLASHSP datasheet(77/96 Pages) MICROCHIP

77 / 96 page

Preliminary

DS39662B-page 75

ENC28J60

15.0

BUILT-IN SELF-TEST

CONTROLLER

The ENC28J60 features a Built-in Self-Test (BIST)

module which is designed to confirm proper operation

of each bit in the 8-Kbyte memory buffer. Although it is

primarily useful for testing during manufacturing, it

remains present and available for diagnostic purposes

by the user. The controller writes to all locations in the

buffer memory and requires several pieces of hardware

shared by normal Ethernet operations. Thus, the BIST

should only be used on Reset or after necessary

hardware is freed. When the BIST is used, the ECON1

clear.

The BIST controller is operated through four registers:

• EBSTCON register (control and status register)

• EBSTSD register (fill seed/initial shift value)

• EBSTCSH and EBSTCSL registers (high and low

bytes of generated checksum)

The EBSTCON register (Register 15-1) controls the

module’s overall operation, selecting the testing modes

and starting the self-test process. The bit pattern for

memory tests is provided by the EBSTSD seed regis-

ter; its content is either used directly, or as the seed for

a pseudo-random number generator, depending on the

Test mode.

EBSTCON: ETHERNET SELF-TEST CONTROL REGISTER

R/W-0

PSV2

PSV1

PSV0

PSEL

TMSEL1

TMSEL0

TME

BISTST

bit 7

bit 0

Legend:

R = Readable bit

W = Writable bit

U = Unimplemented bit, read as ‘0’

-n = Value at POR

‘1’ = Bit is set

‘0’ = Bit is cleared

x = Bit is unknown

bit 7-5

PSV2:PSV0: Pattern Shift Value bits

When TMSEL<1:0> = 10:

The bits in EBSTSD will shift left by this amount after writing to each memory location.

When TMSEL<1:0> = 00, 01 or 11:

This value is ignored.

bit 4

PSEL: Port Select bit

= DMA and BIST modules will swap ports when accessing the memory

= Normal configuration

bit 3-2

TMSEL1:TMSEL0: Test Mode Select bits

= Reserved

= Pattern shift fill

= Address fill

= Random data fill

bit 1

TME: Test Mode Enable bit

= Enable Test mode

= Disable Test mode

bit 0

BISTST: Built-in Self-Test Start/Busy bit

= Test in progress; cleared automatically when test is done

= No test running

ENC28J60-C/SP 数据表(PDF) 77 Page - Microchip Technology

ENC28J60-C/SP 数据表(HTML) 77 Page - Microchip Technology

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