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ADE75 数据表(PDF) 46 Page - Analog Devices

部件名 ADE75
功能描述  Single-Phase Energy Measurement IC with 8052 MCU, RTC and LCD driver
PDF  148 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

ADE75 数据表(HTML) 46 Page - Analog Devices

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Preliminary Technical Data
ADE75xx/ADE71xx
Rev. PrE | Page 46 of 148
x1, x2, x4,
x8, x16
ANALOG
INPUT
RANGE
HPF
ADC
REFERENCE
V2
0V
0.5V, 0.25V,
0.125V, 62.5mV,
31.3mV
WAVEFORM SAMPLE
REGISTER
VOLTAGE RMS (VRMS)
CALCULATION
VP
PGA2
V2
{GAIN[7:5]}
VOLTAGE CHANNEL
WAVEFORM
DATA RANGE
0xD70B
0x0000
0x28F5
ACTIVE AND REACTIVE
POWER CALCULATION
LPF1
f3dB = 63.7Hz
MODE1[6]
ZX SIGNAL
DATA RANGE for 60Hz signal
0xE230
0x0000
0x1DD0
ZX DETECTION
ZX SIGNAL
DATA RANGE for 50Hz signal
0xDFC9
0x0000
0x2037
VOLTAGE PEAK DETECT
Figure 22. ADC and Signal Processing in Voltage Channel
Channel Sampling
The waveform samples of the current ADC and voltage ADC
can also be routed to the waveform registers to be read by the
MCU core. The active, reactive, apparent power, and energy
calculation remain uninterrupted during waveform sampling.
When in waveform sampling mode, one of four output sample
rates can be chosen by using Bits 0 and 1 of the WAVMODE
register (WAVSEL1,0). The output sample rate can be 25.6 kSPS,
12.8kSPS, 6.4 kSPS, or 3.2 kSPS—see Table 31. If the WFSM
enable bit is set in the Interrupt Enable Register 3 SFR
(MIRQENH, 0xDB), the 8052 core has a pending ADE
interrupt. The sampled signals selected in the WAVMODE
register will be latched into the Waveform SFRs when the
waveform high byte (WAV1H or WAV2H) is read.
The ADE interrupt stays active until the WFSM status bit is
cleared—see Energy measurement interrupts section.
FAULT DETECTION13
The ADE75xx/ADE71xx incorporates a fault detection scheme
that warns of fault conditions and allows the
ADE75xx/ADE71xx to continue accurate measurement during
a fault event. The ADE75xx/ADE71xx does this by continuously
monitoring both current inputs (IA and IB). These currents will
be referred for ease of understanding as phase and neutral
(return) currents. In the ADE75xx/ADE71xx, a fault condition
is defined when the difference between IA and IB is greater than
13 This function is not available in ADE7566 and ADE7569 products.
6.25% of the active channel. If a fault condition is detected and
the inactive channel is larger than the active channel, the
ADE75xx/ADE71xx automatically switches to current
measurement to the inactive channel. During a fault, the active,
reactive, current rms and apparent powers are generated using
the larger of the two currents. On power-up, IA is the current
input selected for Active, Reactive, and Apparent power and
Irms calculations.
To prevent false alarm, averaging is done for the fault detection
and a fault condition is detected approximately 1 second after
the event. The fault detection is automatically disabled when the
voltage signal is less than 0.3% of the full-scale input range. This
eliminates false detection of a fault due to noise at light loads.
Because the ADE75xx/ADE71xx looks for a difference between
the voltage signals on IA and IB, it is important that both current
transducers be closely matched.
Channel selection Indication
The current channel selected for measurement is indicated by
bit 7 (ICHANNEL) in the ACCMODE register (0x0F). When
this bit is cleared, IA is selected and when it is set, IB is selected.
The ADE75xx/ADE71xx automatically switches from one
channel to the other and reports the channel configuration in
the ACCMODE register (0x0F).
The current channel selected for measurement can also be
forced. Setting one of the SELCH1A and SELCH1B bits in the
CALMODE register (0x3D) selects IA and IB respectively. When



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