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ADE75 数据表(PDF) 47 Page - Analog Devices

部件名 ADE75
功能描述  Single-Phase Energy Measurement IC with 8052 MCU, RTC and LCD driver
PDF  148 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

ADE75 数据表(HTML) 47 Page - Analog Devices

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Preliminary Technical Data
ADE75xx/ADE71xx
Rev. PrE | Page 47 of 148
both bits are cleared or set, the current channel used for
measurement is selected automatically based on the Fault
detection.
Fault Indication
The ADE75xx/ADE71xx provides an indication of the part
going in or out of a fault condition. The new fault condition is
indicated by the FAULTSIGN flag (bit5) in the Interrupt Status
Register 1 SFR (MIRQSTL, 0xDC).
When FAULTSIGN bit (bit 6) of ACCMODE register (0x0F) is
cleared, the FAULTSIGN flag in the Interrupt Status Register 1
SFR (MIRQSTL, 0xDC) will be set when the part is entering
fault condition.
When FAULTSIGN bit (bit 6) of ACCMODE register (0x0F) is
set, the FAULTSIGN flag in the Interrupt Status Register 1 SFR
(MIRQSTL, 0xDC) will be set when the part is entering normal
condition.
When the FAULTSIGN bit is set in the Interrupt Enable
Register 1 SFR (MIRQENL, 0xD9), and the FAULTSIGN flag in
the Interrupt Status Register 1 SFR (MIRQSTL, 0xDC) is set, the
8052 core has a pending ADE interrupt.
Fault with Active Input Greater than Inactive
Input
If IA is the active current input (that is, being used for billing),
and the voltage signal on IB (inactive input) falls below 93.75%
of IA, and the FAULTSIGN bit (bit 6) of ACCMODE register
(0x0F) is cleared, the FAULTSIGN flag in the Interrupt Status
Register 1 SFR (MIRQSTL, 0xDC) is set. Both analog inputs are
filtered and averaged to prevent false triggering of this logic
output. As a consequence of the filtering, there is a time delay of
approximately 3 s on the logic output after the fault event. The
FAULTSIGN flag is independent of any activity. Because IA is
the active input and it is still greater than IB, billing is
maintained on IA, that is, no swap to the IB input occurs. IA
remains the active input.
Fault with Inactive Input Greater than Active
Input
If the difference between IB, the inactive input, and IA, the active
input (that is, being used for billing), becomes greater than
6.25% of IB, and the FAULTSIGN bit (bit 6) of ACCMODE
register (0x0F) is cleared, the FAULTSIGN flag in the Interrupt
Status Register 1 SFR (MIRQSTL, 0xDC) is set. The analog
input IB becomes the active input. Again, a time constant of
about 3 s is associated with this swap. IA does not swap back to
the active channel until IA is greater than IB and the difference
between IA and IB—in this order—becomes greater than 6.25%
of IB. However, if FAULTSIGN bit (bit 6) of ACCMODE
register (0x0F) is set, the FAULTSIGN flag in the Interrupt
Status Register 1 SFR (MIRQSTL, 0xDC) will be set as soon as
IA is within 6.25% of IB. This threshold eliminates potential
chatter between IA and IB.
Calibration Concerns
Typically, when a meter is being calibrated, the voltage and
current circuits are separated as shown in Figure 23. This means
that current passes through only the phase or neutral circuit.
Figure 23 shows current being passed through the phase circuit.
This is the preferred option, because the ADE75xx/ADE71xx
starts billing on the input IA on power-up. The phase circuit CT
is connected to IA in the diagram. As the current sensors are not
perfectly matched, it is important to match current inputs. The
ADE75xx/ADE71xx provides a gain calibration register for IB,
IBGAIN (address 0x1C). IBGAIN is a 12-bit signed 2-
complement register that provides a gain resolution of
0.0244%/LSB.
For calibration, a first measurement should be done on IA by
setting SEL_I_CH bits to 0b01 in the CALMODE register
(0x3D). This measurement should be compared to the
measurement on IB. Measuring IB can be forced by setting
SEL_I_CH bits to 0b10 in the CALMODE register (0x3D). The
Gain error between these two measurements can be evaluated
using:
()
()
( )
()
A
A
B
I
t
Measuremen
I
t
Measuremen
I
t
Measuremen
Error
=
%
The two channels IA and IB can then be matched by writing: –
Error(%) / (1 + Error (%)) * 212 to IBGAIN register. This
matching adjustment will be valid for all energy measurements,
Active power, reactive power, Irms, and Apparent power, made
by the ADE75xx/ADE71xx.
AGND
IB
IN
IA
RF
RF
CF
CF
CT
CT
RB
RB
0V
VA
0
IB
RF
RA
VP
RF
VN
CT
CF
V
TEST
CURRENT
240V RMS
Figure 23. Fault Conditions for Inactive Input Greater than Active Input
di/dt CURRENT SENSOR AND
DIGITAL INTEGRATOR14
A di/dt sensor detects changes in magnetic field caused by ac
current. Figure 24 shows the principle of a di/dt current sensor.
14 This function is not available in ADE7566 and ADE7166 products.



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