| 数据搜索系统,热门电子元器件搜索 |
|
ADE75 数据表(PDF) 47 Page - Analog Devices |
|
|
|||||||||||||||||||||||||||||
ADE75 数据表(HTML) 47 Page - Analog Devices |
|
47 / 148 page ![]() Preliminary Technical Data ADE75xx/ADE71xx Rev. PrE | Page 47 of 148 both bits are cleared or set, the current channel used for measurement is selected automatically based on the Fault detection. Fault Indication The ADE75xx/ADE71xx provides an indication of the part going in or out of a fault condition. The new fault condition is indicated by the FAULTSIGN flag (bit5) in the Interrupt Status Register 1 SFR (MIRQSTL, 0xDC). When FAULTSIGN bit (bit 6) of ACCMODE register (0x0F) is cleared, the FAULTSIGN flag in the Interrupt Status Register 1 SFR (MIRQSTL, 0xDC) will be set when the part is entering fault condition. When FAULTSIGN bit (bit 6) of ACCMODE register (0x0F) is set, the FAULTSIGN flag in the Interrupt Status Register 1 SFR (MIRQSTL, 0xDC) will be set when the part is entering normal condition. When the FAULTSIGN bit is set in the Interrupt Enable Register 1 SFR (MIRQENL, 0xD9), and the FAULTSIGN flag in the Interrupt Status Register 1 SFR (MIRQSTL, 0xDC) is set, the 8052 core has a pending ADE interrupt. Fault with Active Input Greater than Inactive Input If IA is the active current input (that is, being used for billing), and the voltage signal on IB (inactive input) falls below 93.75% of IA, and the FAULTSIGN bit (bit 6) of ACCMODE register (0x0F) is cleared, the FAULTSIGN flag in the Interrupt Status Register 1 SFR (MIRQSTL, 0xDC) is set. Both analog inputs are filtered and averaged to prevent false triggering of this logic output. As a consequence of the filtering, there is a time delay of approximately 3 s on the logic output after the fault event. The FAULTSIGN flag is independent of any activity. Because IA is the active input and it is still greater than IB, billing is maintained on IA, that is, no swap to the IB input occurs. IA remains the active input. Fault with Inactive Input Greater than Active Input If the difference between IB, the inactive input, and IA, the active input (that is, being used for billing), becomes greater than 6.25% of IB, and the FAULTSIGN bit (bit 6) of ACCMODE register (0x0F) is cleared, the FAULTSIGN flag in the Interrupt Status Register 1 SFR (MIRQSTL, 0xDC) is set. The analog input IB becomes the active input. Again, a time constant of about 3 s is associated with this swap. IA does not swap back to the active channel until IA is greater than IB and the difference between IA and IB—in this order—becomes greater than 6.25% of IB. However, if FAULTSIGN bit (bit 6) of ACCMODE register (0x0F) is set, the FAULTSIGN flag in the Interrupt Status Register 1 SFR (MIRQSTL, 0xDC) will be set as soon as IA is within 6.25% of IB. This threshold eliminates potential chatter between IA and IB. Calibration Concerns Typically, when a meter is being calibrated, the voltage and current circuits are separated as shown in Figure 23. This means that current passes through only the phase or neutral circuit. Figure 23 shows current being passed through the phase circuit. This is the preferred option, because the ADE75xx/ADE71xx starts billing on the input IA on power-up. The phase circuit CT is connected to IA in the diagram. As the current sensors are not perfectly matched, it is important to match current inputs. The ADE75xx/ADE71xx provides a gain calibration register for IB, IBGAIN (address 0x1C). IBGAIN is a 12-bit signed 2- complement register that provides a gain resolution of 0.0244%/LSB. For calibration, a first measurement should be done on IA by setting SEL_I_CH bits to 0b01 in the CALMODE register (0x3D). This measurement should be compared to the measurement on IB. Measuring IB can be forced by setting SEL_I_CH bits to 0b10 in the CALMODE register (0x3D). The Gain error between these two measurements can be evaluated using: () () ( ) () A A B I t Measuremen I t Measuremen I t Measuremen Error − = % The two channels IA and IB can then be matched by writing: – Error(%) / (1 + Error (%)) * 212 to IBGAIN register. This matching adjustment will be valid for all energy measurements, Active power, reactive power, Irms, and Apparent power, made by the ADE75xx/ADE71xx. AGND IB IN IA RF RF CF CF CT CT RB RB 0V VA 0 IB RF RA VP RF VN CT CF V TEST CURRENT 240V RMS Figure 23. Fault Conditions for Inactive Input Greater than Active Input di/dt CURRENT SENSOR AND DIGITAL INTEGRATOR14 A di/dt sensor detects changes in magnetic field caused by ac current. Figure 24 shows the principle of a di/dt current sensor. 14 This function is not available in ADE7566 and ADE7166 products. |
|
链接网址 |
| ALLDATASHEET是否为您带来帮助? [ DONATE ] |
关于 Alldatasheet | 广告服务 | 联系我们 | 隐私政策 | 数据表链接 | 链接交换 | 制造商名单 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |