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H8S/2225 数据表(PDF) 964 Page - Renesas Technology Corp |
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H8S/2225 数据表(HTML) 964 Page - Renesas Technology Corp |
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964 / 1071 page ![]() Section 27 Electrical Characteristics Rev. 5.00 Aug 08, 2006 page 878 of 982 REJ09B0054-0500 Condition A Condition B Condition C Item Symbol Min Max Min Max Min Max Unit Test Conditions Read data access time 2 tACC2 1.5 × tcyc − 50 1.5 × tcyc − 90 1.5 × tcyc − 40 ns Figures 27.14 to 27.18 Read data access time 3 tACC3 2.0 × tcyc − 55 2.0 × tcyc − 90 2.0 × tcyc − 50 ns Read data access time 4 tACC4 2.5 × tcyc − 50 2.5 × tcyc − 90 2.5 × tcyc − 40 ns Read data access time 5 tACC5 3.0 × tcyc − 55 3.0 × tcyc − 90 3.0 × tcyc − 50 ns WR delay time 1 tWRD1 40 90 25 ns WR delay time 2 tWRD2 40 90 25 ns WR pulse width 1 tWSW1 1.0 × tcyc − 20 1.0 × tcyc − 60 1.0 × tcyc − 20 ns WR pulse width 2 tWSW2 1.5 × tcyc − 20 1.5 × tcyc − 60 1.5 × tcyc − 20 ns Write data delay time tWDD 60 100 40 ns Write data setup time tWDS 0.5 × tcyc − 57 0.5 × tcyc − 80 0.5 × tcyc − 65 ns Write data hold time tWDH 0.5 × tcyc − 27 0.5 × tcyc − 60 0.5 × tcyc − 20 ns WAIT setup time tWTS 40 90 25 ns WAIT hold time tWTH 10 10 10 ns Figure 27.16 BREQ setup time tBRQS 40 90 25 ns BACK delay time tBACD 40 90 40 ns Bus-floating time tBZD 60 160 50 ns Figure 27.19 |
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