BQ28Z560-R1 datasheet(5/60 Pages) TI1

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Input/Output

Oscillator

System Clock

Linear

Regulator 2 .5 V

CoolRISC

CPU

Program Memory

16 k x 22 FLASH

AND

6 k x 22 Mask ROM

Data Memory

1k x 8 SRAM

AND

1k x 8 FLASH

Communications

I2C (slave)

Peripherals

Interrupt

Controller

Analog Front End

Delta- Sigma ADC

AND

Integrating

Coulomb Counter

DMAddr (16-bit)

Data (8-bit)

PMAddr

(15-bit)

PMInst

(22-bit)

System Clocks

SRP

SRN

System I/O (13-bit)

AD0–3 (RC0–3)

DATA

Event

(RA0)

Vss

VREG

Reset*

SDA

SCL

BAT

VSS

SDA

TEST

Oscillator

Protection

Logic Control

SRN

Over Discharge

Comparator

Overcharge

Comparator

Short Circuit

Comparator

Overload

Comparator

Overcharge

Current

Comparator

TEST

VSS

GPIO

DOUT

COUT

VSS

BAT

VREG

0.1 µF

0. 1

0.1 µF

0.47µF

10k

100

10 m

0.1 µF

510

0.1 µF

100

5V6

PACK+

PACK–

SDA

SCL

µF

bq28z560-R1

www.ti.com

SLUSBD3 – APRIL 2013

BLOCK DIAGRAM

Figure 3. Block Diagram

ABSOLUTE MAXIMUM RATINGS

All voltages are referenced to the VSS pin. Over operating free-air temperature range (unless otherwise noted)

(1)

PARAMETER

VALUE

UNIT

VBAT

Input voltage, BAT (Pin 4)

–0.3 to 12

VVM

VM terminal voltage (Pin 3)

VBAT – 32 to VBAT + 0.3

VCOUT

COUT terminal input voltage (Pin 2)

VBAT – 32 to VBAT + 0.3

VDOUT

DOUT terminal input voltage (Pin 1)

VSS – 0.3 to VBAT + 0.3

VIOD

All other pins (Pins 5, 7, 8, 9, and 12)

–0.3 to 6

VSDATA

SDA (Pin 10)

VSS – 0.3 to VBAT + 0.3

VSCLK

SCL (Pin 11)

VSS – 0.3 to VBAT + 0.3

ESD

Human body model

±2

ESD

Machine model

±200

Operating free-air temperature range

–40°C to 85

°C

Tstg

Storage temperature range

–65°C to 150

°C

(1)

Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings

only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating

conditions” is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.

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