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BQ28Z560-R1 数据表(PDF) 9 Page - Texas Instruments

部件名 BQ28Z560-R1
功能描述  Single Cell Li-Ion Battery Gas Gauge and Protection
PDF  60 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

BQ28Z560-R1 数据表(HTML) 9 Page - Texas Instruments

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t(B)
t(BR)
t(HW1)
t(HW0)
t(CYCH)
t(DW1)
t(DW
t(CYCD)
Break
7-bit address
8-bit data
(a) Break and Break Recovery
(c) Host Transmitted Bit
(d) Gauge Transmitted Bit
(e) Gauge to Host Response
1.2V
t(RISE)
(b) HDQ line rise time
1-bit
R/W
t(RSPS)
0)
bq28z560-R1
www.ti.com
SLUSBD3 – APRIL 2013
ADC (TEMPERATURE AND CELL VOLTAGE) CHARACTERISTICS (continued)
TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Z(ADC1)
Effective input resistance (TS) (1)
8
M
Ω
Effective input resistance (BAT) (1) bq28z560-R1 not measuring cell voltage
8
M
Ω
Z(ADC2)
bq28z560-R1 measuring cell voltage
100
k
Ω
Ilkg(ADC)
Input leakage current (1)
0.3
µA
(1)
Specified by design. Not production tested.
DATA FLASH MEMORY CHARACTERISTICS
TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Data retention (1)
10
Years
tDR
Flash programming write-cycles (1)
20,000
Cycles
tWORDPROG
Word programming time (1)
2
ms
ICCPROG
Flash-write supply current (1)
5
10
mA
(1)
Specified by design. Not production tested.
HDQ COMMUNICATION TIMING CHARACTERISTICS
TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted).
Capacitance on GPIO is 10 pF unless otherwise specified
(1).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
t(CYCH)
Cycle time, host to bq28z560-R1
190
μs
t(CYCD)
Cycle time, bq28z560-R1 to host
190
205
250
μs
t(HW1)
Host sends 1 to bq28z560-R1
0.5
50
μs
t(DW1)
bq28z560-R1 sends 1 to host
32
50
μs
t(HW0)
Host sends 0 to bq28z560-R1
86
145
μs
t(DW0)
bq28z560-R1 sends 0 to host
80
145
μs
Response time, bq28z560-R1 to
t(RSPS)
190
950
μs
host
t(B)
Break Time
190
μs
t(BR)
Break Recovery Time
40
μs
HDQ Line Rising Time to Logic 1
t(RISE)
950
ns
(1.2 V)
(1)
Parameters specified by worst-case test program execution in FAST mode.
Figure 4. HDQ Timing
Copyright © 2013, Texas Instruments Incorporated
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Product Folder Links: bq28z560-R1



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