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BQ28Z560-R1 数据表(PDF) 8 Page - Texas Instruments |
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BQ28Z560-R1 数据表(HTML) 8 Page - Texas Instruments |
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8 / 60 page ![]() bq28z560-R1 SLUSBD3 – APRIL 2013 www.ti.com INTERNAL TEMPERATURE SENSOR CHARACTERISTICS TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT GTEMP Temperature sensor voltage gain –2.0 mV/°C HIGH FREQUENCY OSCILLATOR TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT f(OSC) Operating frequency 2.097 MHz TA = 0°C to 60°C –2.0 0.38 2.0 % f(EIO) Frequency error (1), (2) TA = –20°C to 70°C –3.0 0.38 3.0 % TA = –40°C to 85°C –4.5 0.38 4.5 % t(SXO) Start-up time (3) 2.5 5 ms (1) The frequency error is measured from 2.097 MHz. (2) The frequency drift is included and measured from the trimmed frequency at VCC = 2.5 V, TA = 25°C. (3) The startup time is defined as the time it takes for the oscillator output frequency to be ±3%. LOW FREQUENCY OSCILLATOR TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT f(LOSC) Operating frequency 32.768 kHz TA = 0°C to 60°C –1.5 0.25 1.5 % f(LEIO) Frequency error (1), (2) TA = –20°C to 70°C –2.5 0.25 2.5 % TA = –40°C to 85°C –4.0 0.25 4.0 % t(LSXO) Start-up time (3) 500 μs (1) The frequency drift is included and measured from the trimmed frequency at VCC = 2.5 V, TA = 25°C. (2) The frequency error is measured from 32.768 kHz. (3) The startup time is defined as the time it takes for the oscillator output frequency to be ±3%. INTEGRATING ADC (COULOMB COUNTER) CHARACTERISTICS TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Input voltage range, V(SRN) and VIN(SR) VSR = V(SRN) – V(SRP) –0.125 0.125 V V(SRP) Conversion time Single conversion 1 s tCONV(SR) Resolution 14 15 bits VOS(SR) Input offset 10 µV INL Integral non-linearity error ±0.007 ±0.034 FSR ZIN(SR) Effective input resistance(1) 2.5 M Ω Ilkg(SR) Input leakage current(1) 0.3 µA (1) Specified by design. Not production tested. ADC (TEMPERATURE AND CELL VOLTAGE) CHARACTERISTICS TA = –40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIN(ADC) Input voltage range –0.2 1 V Conversion time 125 ms tCONV(ADC) Resolution 14 15 bits VOS(ADC) Input offset 1 mV 8 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq28z560-R1 |
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