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STLUX385ATR 数据表(PDF) 91 Page - STMicroelectronics |
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STLUX385ATR 数据表(HTML) 91 Page - STMicroelectronics |
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91 / 99 page ![]() DocID024387 Rev 2 91/98 STLUX385A Electrical characteristics 10.4 EMC characteristics 10.4.1 Electrostatic discharge (ESD) Electrostatic discharges (3 positive then 3 negative pulses separated by 1 second) are applied to the pins of each sample according to each pin combination. The sample size depends on the number of supply pins in the device (3 parts*(n+1) supply pin). 10.4.2 Static latch-up Two complementary static tests are required on 10 parts to assess the latch-up performance. A supply overvoltage (applied to each power supply pin) and a current injection (applied to each input, output and configurable I/O pin) are performed on each sample. This test conforms to the EIA/JESD 78 IC latch-up standard. Table 57. ESD absolute maximum ratings Symbol Ratings Conditions Maximum value Unit V ESD(HBM) Electrostatic discharge voltage (human body model) T A = 25 °C, conforming to JEDEC/JESD22-A114E 2000 V V ESD(CDM) Electrostatic discharge voltage (charge device model) T A = 25 °C, conforming to ANSI/ESD STM 5.3.1 ESDA 500 V ESD(MM) Electrostatic discharge voltage (machine model) T A = 25 °C, conforming to JEDEC/JESD-A115-A 200 Table 58. Electrical sensitivity Symbol Parameter Conditions Level LU Static latch-up class T A = 105 °C A |
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