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AN2014 数据表(PDF) 45 Page - STMicroelectronics

部件名 AN2014
功能描述  How a designer can make the most of STMicroelectronics serial EEPROMs
PDF  65 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

AN2014 数据表(HTML) 45 Page - STMicroelectronics

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AN2014
Software considerations
64
5.5
Cycling endurance and data retention
Even if EEPROM devices are able to withstand a very high number of write cycles, the
EEPROM should not be used in replacement for a non-volatile RAM buffer. The cycling
budget during application life has to be considered.
5.5.1
Cycling and data retention qualification procedures
Cycling qualification
During the cycling qualification, ST EEPROM devices are cycled with a dedicated test
program which allows to program in one single write cycle the whole memory array with the
same byte value. ST can thus guarantee that, for each write operation performed with this
test program:
each memory array cell is cycled once;
the logic and the associated internal voltages that control the write cycles are cycled
once.
Therefore, in a device specified as 4 Mcycles, the qualification results allow to consider that
each byte can be cycled 4 million times.
Data retention qualification
The data retention qualification tests check that the data written to the EEPROM remain
available with a correct programming level after a bake at 150 °C during 1000 hours (high
temperature significantly accelerates the data retention drift).
5.5.2
Optimal cycling with ECC
Some ST EEPROM devices embed an internal ECC (error correction code) logic which
improves data retention performance. This ECC logic must be taken into account when
defining the application cycling budget.
For devices embedding the ECCx4, the ECCx4 logic compares each group of 4 bytes with 6
additional EEPROM ECC bits associated with each group of 4 bytes. As a result, if a single
bit out of 4 bytes of data happens to be erroneous during a read operation, the ECC detects
it and corrects it with the correct value in the output stream of data (read data). The
EEPROM cell read reliability is therefore improved by using this feature.
However even if a single byte has to be written, 4 bytes are internally modified (plus the
ECC bits), that is, the addressed byte is cycled together with the three other bytes making
up the group.
For example:
Writing one byte at address 0000h internally programs this byte plus the 3 following
bytes and ECC bits.
Writing the next byte at address 0001h internally programs this byte plus the 3
contiguous bytes (address 0000h, 0002h, 0003h), and the ECC bits.
Writing the next byte at address 0002h internally programs this byte plus the 3
contiguous bytes (address 0000h, 0001h, 0003h), and the ECC bits.
Wring the next byte at address 0003h, internally programs this byte plus the 3
contiguous bytes (address 0000h, 0001h, 0002h), and the ECC bits.



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