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EDBA164B4PR-1DATF-R 数据表(PDF) 136 Page - Micron Technology |
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EDBA164B4PR-1DATF-R 数据表(HTML) 136 Page - Micron Technology |
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136 / 152 page ![]() Table 91: AC Timing (Continued) Notes 1–2 apply to all parameters and conditions. AC timing parameters must satisfy the tCK minimum conditions (in mul- tiples of tCK) as well as the timing specifications when values for both are indicated. Parameter Symbol Min/ Max tCK Min Data Rate Unit Notes 1066 933 800 667 533 400 333 tDQSCK derating tDQSCK (derated) MAX – 5620 6000 6000 6000 6000 6000 6000 ps Core timing temperature derating tRCD (derated) MIN – tRCD + 1.875 ns tRC (derated) MIN – tRC + 1.875 ns tRAS (derated) MIN – tRAS + 1.875 ns tRP (derated) MIN – tRP + 1.875 ns tRRD (derated) MIN – tRRD + 1.875 ns Notes: 1. Frequency values are for reference only. Clock cycle time (tCK) is used to determine de- vice capabilities. 2. All AC timings assume an input slew rate of 1 V/ns. 3. READ, WRITE, and input setup and hold values are referenced to VREF. 4. tDQSCKDS is the absolute value of the difference between any two tDQSCK measure- ments (in a byte lane) within a contiguous sequence of bursts in a 160ns rolling window. tDQSCKDS is not tested and is guaranteed by design. Temperature drift in the system is <10˚C/s. Values do not include clock jitter. 5. tDQSCKDM is the absolute value of the difference between any two tDQSCK measure- ments (in a byte lane) within a 1.6 μs rolling window. tDQSCKDM is not tested and is guaranteed by design. Temperature drift in the system is <10˚C/s. Values do not include clock jitter. 6. tDQSCKDL is the absolute value of the difference between any two tDQSCK measure- ments (in a byte lane) within a 32ms rolling window. tDQSCKDL is not tested and is guaranteed by design. Temperature drift in the system is <10˚C/s. Values do not include clock jitter. For LOW-to-HIGH and HIGH-to-LOW transitions, the timing reference is at the point when the signal crosses the transition threshold (VTT). tHZ and tLZ transitions occur in the same access time (with respect to clock) as valid data transitions. These parameters are not referenced to a specific voltage level but to the time when the device output is no longer driving (for tRPST, tHZ(DQS) and tHZ(DQ)), or begins driving (for tRPRE, tLZ(DQS), tLZ(DQ)). The figure below shows a method to calculate the point when the device is no longer driving tHZ(DQS) and tHZ(DQ) or begins driving tLZ(DQS) and tLZ(DQ) by measuring the signal at two different voltages. The actual voltage measurement points are not critical as long as the calculation is consistent. The parameters tLZ(DQS), tLZ(DQ), tHZ(DQS), and tHZ(DQ) are defined as single-ended. The timing parameters tRPRE and tRPST are determined from the differential signal DQS_t/DQS_c. Output Transition Timing 216-Ball and 220-Ball, Dual-Channel LPDDR2 SDRAM AC Timing 09005aef85eb530a 216b_220b_2ch_2e0e_embedded_lpddr2.pdf – Rev. F 08 /16 EN 136 Micron Technology, Inc. reserves the right to change products or specifications without notice. © 2014 Micron Technology, Inc. All rights reserved. |
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