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EDBA164B4PR-1DATF-R 数据表(PDF) 136 Page - Micron Technology

部件名 EDBA164B4PR-1DATF-R
功能描述  216-Ball and 220-Ball, Dual-Channel LPDDR2 SDRAM Features
PDF  152 Pages
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制造商  MICRON [Micron Technology]
网页  http://www.micron.com
标志 MICRON - Micron Technology

EDBA164B4PR-1DATF-R 数据表(HTML) 136 Page - Micron Technology

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Table 91: AC Timing (Continued)
Notes 1–2 apply to all parameters and conditions. AC timing parameters must satisfy the tCK minimum conditions (in mul-
tiples of tCK) as well as the timing specifications when values for both are indicated.
Parameter
Symbol
Min/
Max
tCK
Min
Data Rate
Unit Notes
1066
933
800
667
533
400
333
tDQSCK derating
tDQSCK
(derated)
MAX
5620
6000 6000 6000 6000 6000 6000
ps
Core timing temperature
derating
tRCD
(derated)
MIN
tRCD + 1.875
ns
tRC
(derated)
MIN
tRC + 1.875
ns
tRAS
(derated)
MIN
tRAS + 1.875
ns
tRP
(derated)
MIN
tRP + 1.875
ns
tRRD
(derated)
MIN
tRRD + 1.875
ns
Notes:
1. Frequency values are for reference only. Clock cycle time (tCK) is used to determine de-
vice capabilities.
2. All AC timings assume an input slew rate of 1 V/ns.
3. READ, WRITE, and input setup and hold values are referenced to VREF.
4. tDQSCKDS is the absolute value of the difference between any two tDQSCK measure-
ments (in a byte lane) within a contiguous sequence of bursts in a 160ns rolling window.
tDQSCKDS is not tested and is guaranteed by design. Temperature drift in the system is
<10˚C/s. Values do not include clock jitter.
5. tDQSCKDM is the absolute value of the difference between any two tDQSCK measure-
ments (in a byte lane) within a 1.6
μs rolling window. tDQSCKDM is not tested and is
guaranteed by design. Temperature drift in the system is <10˚C/s. Values do not include
clock jitter.
6. tDQSCKDL is the absolute value of the difference between any two tDQSCK measure-
ments (in a byte lane) within a 32ms rolling window. tDQSCKDL is not tested and is
guaranteed by design. Temperature drift in the system is <10˚C/s. Values do not include
clock jitter.
For LOW-to-HIGH and HIGH-to-LOW transitions, the timing reference is at the point
when the signal crosses the transition threshold (VTT). tHZ and tLZ transitions occur in
the same access time (with respect to clock) as valid data transitions. These parameters
are not referenced to a specific voltage level but to the time when the device output is
no longer driving (for tRPST, tHZ(DQS) and tHZ(DQ)), or begins driving (for tRPRE,
tLZ(DQS), tLZ(DQ)). The figure below shows a method to calculate the point when the
device is no longer driving tHZ(DQS) and tHZ(DQ) or begins driving tLZ(DQS) and tLZ(DQ)
by measuring the signal at two different voltages. The actual voltage measurement
points are not critical as long as the calculation is consistent. The parameters tLZ(DQS),
tLZ(DQ), tHZ(DQS), and tHZ(DQ) are defined as single-ended. The timing parameters
tRPRE and tRPST are determined from the differential signal DQS_t/DQS_c.
Output Transition Timing
216-Ball and 220-Ball, Dual-Channel LPDDR2 SDRAM
AC Timing
09005aef85eb530a
216b_220b_2ch_2e0e_embedded_lpddr2.pdf – Rev. F 08 /16 EN
136
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2014 Micron Technology, Inc. All rights reserved.



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