LPC2917 datasheet(57/68 Pages) PHILIPS

57 / 68 page

LPC2917_19_1

Preliminary data sheet

Rev. 1.01 — 15 November 2007

57 of 68

NXP Semiconductors

LPC2917/19

ARM9 microcontroller with CAN and LIN

[1]

All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at Tamb =125 °C ambient

temperature on wafer level. Cased products are tested at Tamb =25 °C (final testing). Both pre-testing and final testing use correlated

test conditions to cover the specified temperature and power supply voltage range.

[2]

This parameter is not part of production testing or final testing, hence only a typical value is stated.

[3]

Oscillator start-up time depends on the quality of the crystal. For most crystals it takes about 1000 clock pulses until the clock is fully

stable.

[4]

Duty cycle clock should be as close as possible to 50%.

ta(W)int

Internal write-access

time.

24.9

UART

fUART

UART frequency.

⁄

65024fclk(uart)

⁄

2fclk(uart)

MHz

SPI

fSPI

SPI operating

frequency.

Master operation.

⁄

65024fclk(spi)

⁄

2fclk(spi)

MHz

Slave operation.

⁄

65024fclk(spi)

⁄

4fclk(spi)

MHz

Jitter Specification

CANtjit(cc)(p-p)

CAN TXD pin

Cycle-to-cycle jitter

(peak-to-peak value).

[2]

-0.4

Table 31.

Dynamic characteristics …continued

VDD(CORE) =VDD(OSC_PLL) ; VDD(IO) = 2.7 V to 3.6 V; VDD(A3V3) = 3.0 V to 3.6 V; Tvj = −40 °C; all voltages are measured with

respect to ground; positive currents flow into the IC; unless otherwise specified.

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

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