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TNETA1575 数据表(PDF) 8 Page - Texas Instruments |
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TNETA1575 数据表(HTML) 8 Page - Texas Instruments |
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8 / 45 page ![]() TNETA1575 ATM SEGMENTATION AND REASSEMBLY DEVICE WITH PCI-HOST AND COPROCESSOR INTERFACES SDNS040C – MAY 1996 – REVISED JUNE 1998 8 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 Terminal Functions (Continued) local-bus interface TERMINAL I/O DESCRIPTION NAME NO. I/O DESCRIPTION LBAD11– LBAD0 194–195, 197, 199–202, 204, 206–209 O (CMOS) Local-bus address. LBAD11–LBAD0 are driven by the TNETA1575 and are used to address the peripheral attached to the local bus. Terminal 194 is the most significant bit. LBR/W 211 O (CMOS) Local-bus read/write. LBR/W is an active-low signal that indicates a write operation and is driven by the TNETA1575. A read operation is indicated as active high. LBCS1 99 O (CMOS) Local-bus chip select 1. LBCS1 is an active-low signal that is used to select an external peripheral on the TNETA1575 local bus. LBCS2 212 O (CMOS) Local-bus chip select. 2 LBCS2 is an active-low signal that is used to select an external peripheral on the TNETA1575 local bus. LBREADY 214 I (TTL) (with internal pullup) Local-bus ready. LBREADY is driven by a local-bus slave device. The TNETA1575 has two modes of operation on this input terminal. The default mode causes the TNETA1575 to complete the bus transaction after eight PCI-bus cycles, regardless of LBREADY. Alternatively, the TNETA1575 can be placed in a mode using LBREADY. This is a 3.3-V tolerant input signal. If it is driven by a 5-V signal, it must be connected to an external voltage divider consisting of a 36-k Ω down resistor and a 24-kΩ up resistor to ensure that the input is not driven above 3.3 V. LBINTR 183 I (TTL) (with internal pullup) Local-bus interrupt. LBINTR is an active-low interrupt that is generated and driven by a local-bus device. This signal must be connected to an external 2.2-k Ω pullup resistor that is connected to a 3.3-V voltage source. LBDATA7– LBDATA0 215, 217–220, 222, 224–225 I/O (TTL input / CMOS output) and (with internal pullup) Local-bus data. LBDATA7–LBDATA0 are used to transfer data to and from a local-bus slave device, and are driven by the TNETA1575 or a local-bus slave device. LBDATA7, (terminal 215) is the most significant bit. boundary-scan interface TERMINAL I/O DESCRIPTION NAME NO. I/O DESCRIPTION TCK 103 I (TTL) Test clock. TCK clocks the test-access-port (TAP) operation. TDI 106 I (TTL) Test data input. TDI shifts serial-test data and instructions into the device during TAP operation. TDO 105 O (TTL) Test data output. TDO shifts serial-test data and instructions out of the device during TAP operation. TMS 104 I (TTL) Test-mode select. TMS controls the state of the TAP controller. TRST 102 I (TTL) Test reset. TRST asynchronously forces the TAP controller to a known state. This terminal must be tied low when the JTAG port is not being used. test signal TERMINAL I/O DESCRIPTION NAME NO. I/O DESCRIPTION TESTMODE 101 I (TTL) Test mode. TESTMODE is used for device testing. High is for test mode and low is for normal operation. |
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