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TNETA1575 数据表(PDF) 8 Page - Texas Instruments

部件名 TNETA1575
功能描述  ATM SEGMENTATION AND REASSEMBLY DEVICE WITH PCI-HOST AND COPROCESSOR INTERFACES
PDF  45 Pages
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

TNETA1575 数据表(HTML) 8 Page - Texas Instruments

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TNETA1575
ATM SEGMENTATION AND REASSEMBLY DEVICE
WITH PCI-HOST AND COPROCESSOR INTERFACES
SDNS040C – MAY 1996 – REVISED JUNE 1998
8
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions (Continued)
local-bus interface
TERMINAL
I/O
DESCRIPTION
NAME
NO.
I/O
DESCRIPTION
LBAD11–
LBAD0
194–195, 197,
199–202, 204,
206–209
O
(CMOS)
Local-bus address. LBAD11–LBAD0 are driven by the TNETA1575 and are used to
address the peripheral attached to the local bus. Terminal 194 is the most significant
bit.
LBR/W
211
O
(CMOS)
Local-bus read/write. LBR/W is an active-low signal that indicates a write operation and
is driven by the TNETA1575. A read operation is indicated as active high.
LBCS1
99
O
(CMOS)
Local-bus chip select 1. LBCS1 is an active-low signal that is used to select an external
peripheral on the TNETA1575 local bus.
LBCS2
212
O
(CMOS)
Local-bus chip select. 2 LBCS2 is an active-low signal that is used to select an external
peripheral on the TNETA1575 local bus.
LBREADY
214
I
(TTL)
(with internal
pullup)
Local-bus ready. LBREADY is driven by a local-bus slave device. The TNETA1575 has
two modes of operation on this input terminal. The default mode causes the
TNETA1575 to complete the bus transaction after eight PCI-bus cycles, regardless of
LBREADY. Alternatively, the TNETA1575 can be placed in a mode using LBREADY.
This is a 3.3-V tolerant input signal. If it is driven by a 5-V signal, it must be connected
to an external voltage divider consisting of a 36-k
Ω down resistor and a 24-kΩ up
resistor to ensure that the input is not driven above 3.3 V.
LBINTR
183
I
(TTL)
(with internal
pullup)
Local-bus interrupt. LBINTR is an active-low interrupt that is generated and driven by
a local-bus device. This signal must be connected to an external 2.2-k
Ω pullup resistor
that is connected to a 3.3-V voltage source.
LBDATA7–
LBDATA0
215, 217–220,
222, 224–225
I/O
(TTL input /
CMOS output)
and
(with internal
pullup)
Local-bus data. LBDATA7–LBDATA0 are used to transfer data to and from a local-bus
slave device, and are driven by the TNETA1575 or a local-bus slave device. LBDATA7,
(terminal 215) is the most significant bit.
boundary-scan interface
TERMINAL
I/O
DESCRIPTION
NAME
NO.
I/O
DESCRIPTION
TCK
103
I
(TTL)
Test clock. TCK clocks the test-access-port (TAP) operation.
TDI
106
I
(TTL)
Test data input. TDI shifts serial-test data and instructions into the device during TAP operation.
TDO
105
O
(TTL)
Test data output. TDO shifts serial-test data and instructions out of the device during TAP
operation.
TMS
104
I
(TTL)
Test-mode select. TMS controls the state of the TAP controller.
TRST
102
I
(TTL)
Test reset. TRST asynchronously forces the TAP controller to a known state. This terminal must
be tied low when the JTAG port is not being used.
test signal
TERMINAL
I/O
DESCRIPTION
NAME
NO.
I/O
DESCRIPTION
TESTMODE
101
I
(TTL)
Test mode. TESTMODE is used for device testing. High is for test mode and low is for normal
operation.



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