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TNETX3100 数据表(PDF) 47 Page - Texas Instruments |
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TNETX3100 数据表(HTML) 47 Page - Texas Instruments |
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47 / 80 page ![]() TNETX3100 ThunderSWITCH™ 10-PORT 10-/100-MBIT/S ETHERNET™ SWITCH SPWS031D – JUNE 1997 – REVISED OCTOBER 1997 47 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 supported JTAG instructions (continued) Table 8. Opcodes for JTAG Instructions INSTRUCTION TYPE INSTRUCTION NAME JTAG OPCODE Mandatory EXTEST 000000 Mandatory SAMPLE/PRELOAD 000001 Optional IDCODE 000100 Optional HIGHZ 000101 Mandatory BYPASS 111111 The IDCODE for the TNETX3100 is given in Table 9. Table 9. IDCODE Code VARIANT PART NUMBER MANUFACTURE LEAST-SIGNIFICANT BIT Bit 31 Bit 28 Bit 27 Bit 12 Bit 11 Bit 1 Bit 0 0000 0000000001000110 00000010111 1 manufacturing test features The methodology of these tests is considered before implementation. All tests are based on an incremental approach; for tests using the DIO interface (for example), only the DIO interface should be tested and if it is functioning correctly, the next depth of testing is performed (i.e., internal TNETX3100 testing). If a test fails using this methodology, the cause of the failure can be determined quickly and test/debug time is reduced. primary test access: DIO testing The DIO registers can be written to and read directly from the terminal interface. This level of testing is trivial, but essential before continuing to test the TNETX3100 internally. secondary test access: internal RAM access modes When implementing an architecture that employs embedded RAM structures, it is necessary to ensure test access greater than JTAG-connectivity testing through standard interfacing. The DIO interface used by TNETX3100 enables the user to interrogate the internal RAMS of the TNETX3100. User interrogation gives the required observability for the RAMs and the data they contain. RAM test access is desirable at all levels of testing: • Silicon production level that enables detection of defective devices • System production level that permits diagnostic testing • Field-level that allows diagnostics and debugging |
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