数据搜索系统,热门电子元器件搜索
  Chinese  ▼
ALLDATASHEETCN.COM

X  

TNETX3100 数据表(PDF) 47 Page - Texas Instruments

部件名 TNETX3100
功能描述  ThunderSWITCHE 10-PORT 10-/100-MBIT/S ETHERNETE SWITCH
PDF  80 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

TNETX3100 数据表(HTML) 47 Page - Texas Instruments

Back Button TNETX3100 Datasheet HTML 43Page - Texas Instruments TNETX3100 Datasheet HTML 44Page - Texas Instruments TNETX3100 Datasheet HTML 45Page - Texas Instruments TNETX3100 Datasheet HTML 46Page - Texas Instruments TNETX3100 Datasheet HTML 47Page - Texas Instruments TNETX3100 Datasheet HTML 48Page - Texas Instruments TNETX3100 Datasheet HTML 49Page - Texas Instruments TNETX3100 Datasheet HTML 50Page - Texas Instruments TNETX3100 Datasheet HTML 51Page - Texas Instruments Next Button
Zoom Inzoom in Zoom Outzoom out
 47 / 80 page
background image
TNETX3100
ThunderSWITCH10-PORT 10-/100-MBIT/S ETHERNETSWITCH
SPWS031D – JUNE 1997 – REVISED OCTOBER 1997
47
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
supported JTAG instructions (continued)
Table 8. Opcodes for JTAG Instructions
INSTRUCTION TYPE
INSTRUCTION NAME
JTAG
OPCODE
Mandatory
EXTEST
000000
Mandatory
SAMPLE/PRELOAD
000001
Optional
IDCODE
000100
Optional
HIGHZ
000101
Mandatory
BYPASS
111111
The IDCODE for the TNETX3100 is given in Table 9.
Table 9. IDCODE Code
VARIANT
PART NUMBER
MANUFACTURE
LEAST-SIGNIFICANT BIT
Bit 31
Bit 28 Bit 27
Bit 12 Bit 11
Bit 1
Bit 0
0000
0000000001000110
00000010111
1
manufacturing test features
The methodology of these tests is considered before implementation. All tests are based on an incremental
approach; for tests using the DIO interface (for example), only the DIO interface should be tested and if it is
functioning correctly, the next depth of testing is performed (i.e., internal TNETX3100 testing). If a test fails using
this methodology, the cause of the failure can be determined quickly and test/debug time is reduced.
primary test access: DIO testing
The DIO registers can be written to and read directly from the terminal interface. This level of testing is trivial,
but essential before continuing to test the TNETX3100 internally.
secondary test access: internal RAM access modes
When implementing an architecture that employs embedded RAM structures, it is necessary to ensure test
access greater than JTAG-connectivity testing through standard interfacing. The DIO interface used by
TNETX3100 enables the user to interrogate the internal RAMS of the TNETX3100. User interrogation gives the
required observability for the RAMs and the data they contain.
RAM test access is desirable at all levels of testing:
Silicon production level that enables detection of defective devices
System production level that permits diagnostic testing
Field-level that allows diagnostics and debugging



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80


数据表 下载

Go To PDF Page


链接网址



ALLDATASHEET是否为您带来帮助?  [ DONATE ] 

关于 Alldatasheet   |   广告服务   |   联系我们   |   隐私政策   |   数据表链接    |   链接交换   |   制造商名单
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com