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SPEAR320S 数据表(PDF) 33 Page - STMicroelectronics |
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SPEAR320S 数据表(HTML) 33 Page - STMicroelectronics |
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33 / 113 page  SPEAr320S Pin description Doc ID 022508 Rev 2 33/113 3.3.3 Debug pins 3.3.4 Non-multiplexed pins Table 8. Debug pins description Signal name Description Dir. Pin type Ball TEST_0 Debug mode configuration ports. See also Section Table 32.: Ball sharing during debug. I TTL input buffer, 3.3 V tolerant, PD K16 TEST_1 K15 TEST_2 K14 TEST_3 K13 TEST_4 J15 BOOT_SEL Reserved, to be fixed at high level J14 nTRST Test reset input I TTL Schmitt trigger input buffer, 3.3 V tolerant, PU L16 TDO Test data output O TTL output buffer, 3.3 V capable 4 mA L15 TCK Test clock I TTL Schmitt trigger input buffer, 3.3 V tolerant, PU L17 TDI Test data input I L14 TMS Test mode select I L13 Table 9. SMI pins description Signal name Description Dir. Pin type Ball SMI_DATAIN Serial Flash input data I TTL Input Buffer 3.3 V tolerant, PU M13 SMI_DATAOUT Serial Flash output data O TTL output buffer 3.3 V capable 4 mA M14 SMI_CLK Serial Flash clock IO N17 SMI_CS_0 Serial Flash chip select O M15 SMI_CS_1 M16 |
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