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LSM6DS3 数据表(PDF) 22 Page - STMicroelectronics |
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LSM6DS3 数据表(HTML) 22 Page - STMicroelectronics |
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22 / 100 page ![]() Module specifications LSM6DS3 22/100 DocID026899 Rev 8 7. Noise RMS in Normal/LP mode is the same for all the ODR RMS related to BW = ODR /2 (for ODR /9, typ value can be calculated by Typ *0.6) 8. The sign of the linear acceleration self-test output change is defined by the STx_XL bits in CTRL5_C (14h), Table 60 for all axes. 9. The linear acceleration self-test output change is defined with the device in stationary condition as the absolute value of: OUTPUT[LSb] (self-test enabled) - OUTPUT[LSb] (self-test disabled). 1LSb = 0.061 mg at ±2 g full scale. 10. The sign of the angular rate self-test output change is defined by the STx_G bits in CTRL5_C (14h), Table 59 for all axes. 11. The angular rate self-test output change is defined with the device in stationary condition as the absolute value of: OUTPUT[LSb] (self-test enabled) - OUTPUT[LSb] (self-test disabled). 1LSb = 70 mdps at ±2000 dps full scale. |
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