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PPC8567CVTAQGGA 数据表(PDF) 87 Page - Freescale Semiconductor, Inc |
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PPC8567CVTAQGGA 数据表(HTML) 87 Page - Freescale Semiconductor, Inc |
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87 / 139 page ![]() MPC8568E/MPC8567E PowerQUICC III Integrated Processor Hardware Specifications, Rev. 1 Freescale Semiconductor 87 Serial RapidIO Figure 55. Receiver Input Compliance Mask 15.9 Measurement and Test Requirements Since the LP-Serial electrical specification are guided by the XAUI electrical interface specified in Clause 47 of IEEE 802.3ae-2002, the measurement and test requirements defined here are similarly guided by Clause 47. In addition, the CJPAT test pattern defined in Annex 48A of IEEE 802.3ae-2002 is specified as the test pattern for use in eye pattern and jitter measurements. Annex 48B of IEEE 802.3ae-2002 is recommended as a reference for additional information on jitter test methods. 15.9.1 Eye Template Measurements For the purpose of eye template measurements, the effects of a single-pole high pass filter with a 3 dB point at (Baud Frequency)/1667 is applied to the jitter. The data pattern for template measurements is the Table 64. Receiver Input Compliance Mask Parameters Exclusive of Sinusoidal Jitter Receiver Type VDIFFmin (mV) VDIFFmax (mV) A (UI) B (UI) 1.25 GBaud 100 800 0.275 0.400 2.5 GBaud 100 800 0.275 0.400 3.125 GBaud 100 800 0.275 0.400 1 0 VDIFF max -VDIFF max VDIFF min -VDIFF min Time (UI) 0 AB 1-B 1-A |
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