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ADM1026JSTZ-R7 数据表(PDF) 19 Page - ON Semiconductor

部件名 ADM1026JSTZ-R7
功能描述  Complete Thermal System Management Controller
PDF  55 Pages
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制造商  ONSEMI [ON Semiconductor]
网页  http://www.onsemi.com
标志 ONSEMI - ON Semiconductor

ADM1026JSTZ-R7 数据表(HTML) 19 Page - ON Semiconductor

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ADM1026
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19
If the VREF output is not being used, it should be left
unconnected. Do not connect VREF to GND using a
capacitor. The internal output buffer on the voltage reference
is capacitively loaded, which can cause the voltage reference
to oscillate. This affects temperature readings reported back
by the ADM1026. The recommended interface circuit for
the VREF output is shown in Figure 32.
Figure 32. VREF Interface Circuit for VREF Loads > 2 mA
10k
0.1F
ADM1026
24
+12V
0.1F
10F
50
VREF
NDT3055
VREF
Temperature Measurement System
Local Temperature Measurement
The ADM1026 contains an on-chip band gap temperature
sensor whose output is digitized by the on-chip ADC. The
temperature data is stored in the local temperature value
register (Address 1Fh). As both positive and negative
temperatures can be measured, the temperature data is stored
in twos complement format, as shown in Table 8.
Theoretically, the temperature sensor and ADC can measure
temperatures from −128C to +127C with a resolution of
1C. Temperatures below TMIN and above TMAX are outside
the operating temperature range of the device; however, so
local temperature measurements outside this range are not
possible. Temperature measurement from −128C to
+127C is possible using a remote sensor.
Remote Temperature Measurement
The ADM1026 can measure the temperature of two
remote diode sensors, or diode-connected transistors,
connected to Pins 25 and 26, or 27 and 28.
Pins 25 and 26 are a dedicated temperature input channel.
Pins 27 and 28 can be configured to measure a diode sensor
by clearing Bit 3 of Configuration Register 1 (Address 00h)
to 0. If this bit is 1, then Pins 27 and 28 are AIN8 and AIN9.
The forward voltage of a diode or diode-connected
transistor, operated at a constant current, exhibits a negative
temperature coefficient of about −2 mV/C. Unfortunately,
the absolute value of Vbe varies from device to device, and
individual calibration is required to null this out, so the
technique is unsuitable for mass production.
The technique used in the ADM1026 is to measure the
change in Vbe when the device is operated at two different
currents, given by:
(eq. 10)
DVbe +
K
T
q
log n (N)
where K is Boltzmann’s constant, q is the charge on the
carrier, T is the absolute temperature in Kelvins, and N is the
ratio of the two currents.
Figure 33 shows the input signal conditioning used to
measure the output of a remote temperature sensor. This
figure shows the external sensor as a substrate transistor
provided
for
temperature
monitoring
on
some
microprocessors, but it could equally well be a discrete
transistor such as a 2N3904.
If a discrete transistor is used, the collector is not grounded
and should be linked to the base. If a PNP transistor is used,
the base is connected to the D− input and the emitter to the
D+ input. If an NPN transistor is used, the emitter is
connected to the D− input and the base to the D+ input.
To prevent ground noise from interfering with the
measurement, the more negative terminal of the sensor is not
referenced to ground but is biased above ground by an
internal diode at the D− input.
To measure
DVbe, the sensor is switched between
operating currents of I and N  I. The resulting waveform is
passed through a 65 kHz low−pass filter to remove noise,
and to a chopper-stabilized amplifier that performs the
functions of amplification and rectification of the waveform
to produce a DC voltage proportional to
DVbe. This voltage
is measured by the ADC to give a temperature output in
8-bit, twos complement format. To further reduce the effects
of noise, digital filtering is performed by averaging the
results of 16 measurement cycles. A remote temperature
measurement takes nominally 2.14 ms.
Figure 33. Signal Conditioning for Remote Diode Temperature Sensors
C1*
D+
D–
REMOTE
SENSING
TRANSISTOR
I
N x I
IBIAS
VDD
VOUT+
TO ADC
VOUT–
BIAS
DIODE
LOW−PASS FILTER
fC = 65kHz
CAPACITOR C1 IS OPTIONAL. IT IS ONLY NECESSARY IN NOISY ENVIRONMENTS.
C1 = 2.2nF TYPICAL, 3nF MAX.
*



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