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ADM1026JSTZ-R7 数据表(PDF) 19 Page - ON Semiconductor |
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ADM1026JSTZ-R7 数据表(HTML) 19 Page - ON Semiconductor |
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19 / 55 page ![]() ADM1026 http://onsemi.com 19 If the VREF output is not being used, it should be left unconnected. Do not connect VREF to GND using a capacitor. The internal output buffer on the voltage reference is capacitively loaded, which can cause the voltage reference to oscillate. This affects temperature readings reported back by the ADM1026. The recommended interface circuit for the VREF output is shown in Figure 32. Figure 32. VREF Interface Circuit for VREF Loads > 2 mA 10k 0.1F ADM1026 24 +12V 0.1F 10F 50 VREF NDT3055 VREF Temperature Measurement System Local Temperature Measurement The ADM1026 contains an on-chip band gap temperature sensor whose output is digitized by the on-chip ADC. The temperature data is stored in the local temperature value register (Address 1Fh). As both positive and negative temperatures can be measured, the temperature data is stored in twos complement format, as shown in Table 8. Theoretically, the temperature sensor and ADC can measure temperatures from −128C to +127C with a resolution of 1C. Temperatures below TMIN and above TMAX are outside the operating temperature range of the device; however, so local temperature measurements outside this range are not possible. Temperature measurement from −128C to +127C is possible using a remote sensor. Remote Temperature Measurement The ADM1026 can measure the temperature of two remote diode sensors, or diode-connected transistors, connected to Pins 25 and 26, or 27 and 28. Pins 25 and 26 are a dedicated temperature input channel. Pins 27 and 28 can be configured to measure a diode sensor by clearing Bit 3 of Configuration Register 1 (Address 00h) to 0. If this bit is 1, then Pins 27 and 28 are AIN8 and AIN9. The forward voltage of a diode or diode-connected transistor, operated at a constant current, exhibits a negative temperature coefficient of about −2 mV/C. Unfortunately, the absolute value of Vbe varies from device to device, and individual calibration is required to null this out, so the technique is unsuitable for mass production. The technique used in the ADM1026 is to measure the change in Vbe when the device is operated at two different currents, given by: (eq. 10) DVbe + K T q log n (N) where K is Boltzmann’s constant, q is the charge on the carrier, T is the absolute temperature in Kelvins, and N is the ratio of the two currents. Figure 33 shows the input signal conditioning used to measure the output of a remote temperature sensor. This figure shows the external sensor as a substrate transistor provided for temperature monitoring on some microprocessors, but it could equally well be a discrete transistor such as a 2N3904. If a discrete transistor is used, the collector is not grounded and should be linked to the base. If a PNP transistor is used, the base is connected to the D− input and the emitter to the D+ input. If an NPN transistor is used, the emitter is connected to the D− input and the base to the D+ input. To prevent ground noise from interfering with the measurement, the more negative terminal of the sensor is not referenced to ground but is biased above ground by an internal diode at the D− input. To measure DVbe, the sensor is switched between operating currents of I and N I. The resulting waveform is passed through a 65 kHz low−pass filter to remove noise, and to a chopper-stabilized amplifier that performs the functions of amplification and rectification of the waveform to produce a DC voltage proportional to DVbe. This voltage is measured by the ADC to give a temperature output in 8-bit, twos complement format. To further reduce the effects of noise, digital filtering is performed by averaging the results of 16 measurement cycles. A remote temperature measurement takes nominally 2.14 ms. Figure 33. Signal Conditioning for Remote Diode Temperature Sensors C1* D+ D– REMOTE SENSING TRANSISTOR I N x I IBIAS VDD VOUT+ TO ADC VOUT– BIAS DIODE LOW−PASS FILTER fC = 65kHz CAPACITOR C1 IS OPTIONAL. IT IS ONLY NECESSARY IN NOISY ENVIRONMENTS. C1 = 2.2nF TYPICAL, 3nF MAX. * |
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