ADM1026JSTZ-R7 datasheet(30/55 Pages) ONSEMI

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ADM1026

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Notes:

 For a NAND tree test to work, all outputs (INT,

RSTMAIN, RSTSTBY, and PWM) must remain high

during the test.

 When generating test waveforms, allow for a typical

propagation delay of 500 ns through the NAND tree.

 If any of the inputs shown in Figure 55 are unused, they

should not be connected direct to ground, but via a

resistor such as 10 k

W. This allows the automatic test

equipment (ATE) to drive every input high so that the

NAND tree test can be properly carried out.

Figure 56. NAND Tree Test Taking Inputs High in Turn

GPIO16

GPIO15

GPIO14

GPIO13

GPIO12

GPIO11

GPIO10

GPIO9

GPIO8

FAN0

FAN3

FAN4

FAN5

FAN6

FAN7

INT

NTESTOUT

FAN1

FAN2

SCL

SDA

In the event of an input being nonfunctional (stuck high or

low) or two inputs shorted together, the output pattern is

different. Some examples are given in Figure 58 through

Figure 60.

Figure 58 shows the effect of one input being stuck low.

The output pattern is normal until the stuck input is reached.

Because that input is permanently low, neither it nor any

inputs further up the tree can have any effect on the output.

Figure 57. NAND Tree Test Taking Inputs Low in Turn

INT

SDA

SCL

FAN7

FAN6

FAN3

FAN2

FAN1

GPIO11

GPIO12

GPIO15

FAN5

FAN4

FAN0

GPIO10

GPIO13

GPIO14

GPIO9

GPIO8

NTESTOUT

GPIO16

Figure 58. NAND Tree Test with GPIO11 Stuck Low

GPIO16

GPIO15

GPIO14

GPIO13

GPIO12

GPIO11

GPIO10

GPIO9

GPIO8

FAN0

NTESTOUT

FAN1

Figure 59 shows the effect of one input being stuck high.

Taking GPIO12 high should take the output high. However,

the next input up the tree, GPIO11, is already high, so the

output immediately goes low again, causing a missing pulse

in the output pattern.

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ADM1026JSTZ-R7 数据表(PDF) 30 Page - ON Semiconductor

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