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ADAS1000-4BSTZ 数据表(PDF) 14 Page - Analog Devices

部件名 ADAS1000-4BSTZ
功能描述  Low Power, Three Electrode Electrocardiogram (ECG) Analog Front End
PDF  80 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

ADAS1000-4BSTZ 数据表(HTML) 14 Page - Analog Devices

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ADAS1000-3/ADAS1000-4
Data Sheet
Rev. B | Page 14 of 80
ABSOLUTE MAXIMUM RATINGS
Table 7.
Parameter
Rating
AVDD to AGND
−0.3 V to +6 V
IOVDD to DGND
−0.3 V to +6 V
ADCVDD to AGND
−0.3 V to +2.5 V
DVDD to DGND
−0.3 V to +2.5 V
REFIN/REFOUT to REFGND
−0.3 V to +2.1 V
ECG and Analog Inputs to AGND
−0.3 V to AVDD + 0.3 V
Digital Inputs to DGND
−0.3 V to IOVDD + 0.3 V
REFIN to ADCVDD
ADCVDD + 0.3 V
AGND to DGND
−0.3 V to + 0.3 V
REFGND to AGND
−0.3 V to + 0.3 V
ECG Input Continuous Current
±10 mA
Storage Temperature Range
−65°C to +125°C
Operating Junction Temperature Range
−40°C to +85°C
Reflow Profile
J-STD-20 (JEDEC)
Junction Temperature
150°C max
ESD
HBM
2500 V
FICDM
1000 V
Stresses at or above those listed under Absolute Maximum
Ratings may cause permanent damage to the product. This is a
stress rating only; functional operation of the product at these
or any other conditions above those indicated in the operational
section of this specification is not implied. Operation beyond
the maximum operating conditions for extended periods may
affect product reliability.
THERMAL RESISTANCE
θJA is specified for the worst-case conditions, that is, a device
soldered in a circuit board for surface-mount packages.
Table 8. Thermal Resistance1
Package Type
θJA
Unit
56-Lead LFCSP
35
°C/W
64-Lead LQFP
42.5
°C/W
1 Based on JEDEC standard 4-layer (2S2P) high effective thermal conductivity
test board (JESD51-7) and natural convection.
ESD CAUTION



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