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M58PR256LE 数据表(PDF) 66 Page - STMicroelectronics |
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M58PR256LE 数据表(HTML) 66 Page - STMicroelectronics |
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66 / 119 page ![]() Program and erase times and endurance cycles M58PR256LE, M58PR512LE, M58PR001LE 66/119 13 Program and erase times and endurance cycles The program and erase times and the number of program/ erase cycles per block are shown in Table 23. Exact erase times may change depending on the memory array condition. The best scenario is when all the bits in the block are at ‘0’ (pre-programmed). The worst scenario is when all the bits in the block are at ‘1’ (not preprogrammed). Usually, the system overhead is negligible with respect to the Erase time. In the M58PRxxxLE the maximum number of program/erase cycles depends on the VPP voltage supply used. Table 23. Program/erase times and endurance cycles(1) (2) Parameter Condition Min Typ Typical after 100 kW/E cycles Max Unit Erase EFA block (4 KWord) 0.7 2.5 s Main array block 128 KWord) 0.9 4 s Program(3) Single cell(4) Word Program(5) 50 230 µs Buffer Program 250 500 µs Single word(4) Word Program(5) 50 230 µs Buffer Program 250 500 µs Buffer (512 words) (Buffer Program) 2.15 4.3 ms EFA block (4 KWord) 0.2 0.94 s Main array block (128 KWord) (Buffer Program) 0.55 1.1 s Suspend Latency Program 20 30 µs Erase 20 30 µs Program/Erase cycles (per block) Main array block 100 000 cycles EFA block 100 000 Blank Check Main array block 3.2 ms |
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