ST7LITE20F2 datasheet(132/166 Pages) STMICROELECTRONICS

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Electrical characteristics

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Doc ID 8349 Rev 5

Prequalification trials

Most of the common failures (unexpected reset and program counter corruption) can be

reproduced by manually forcing a low state on the RESET pin or the Oscillator pins for 1

second.

To complete these trials, ESD stress can be applied directly on the device, over the range of

specification values. When unexpected behavior is detected, the software can be hardened

to prevent unrecoverable errors occurring.

Note:

For more details, refer to the application note AN1015.

13.7.2

Electro Magnetic Interference (EMI)

Based on a simple application running on the product (toggling 2 LEDs through the I/O

ports), the product is monitored in terms of emission. This emission test is in line with the

norm SAE J 1752/3 which specifies the board and the loading of each pin.

Note:

Data based on characterization results, not tested in production.

13.7.3

Absolute maximum ratings (Electrical sensitivity)

Based on three different tests (ESD, LU and DLU) using specific measurement methods, the

product is stressed in order to determine its performance in terms of electrical sensitivity.

Note:

For more details, refer to the application note AN1181.

Electro-Static Discharge (ESD)

Electro-Static Discharges (a positive then a negative pulse separated by 1 second) are

applied to the pins of each sample according to each pin combination. The sample size

depends on the number of supply pins in the device (3 parts*(n+1) supply pin). This test

conforms to the JESD22-A114A/A115A standard.

Table 76.

Test results

Symbol

Parameter

Conditions

Level/Class

VFESD

Voltage limits to be applied on any I/O pin

to induce a functional disturbance

VDD=5V, TA=+25°C, fOSC=8MHz

conforms to IEC 1000-4-2

VFFTB

Fast transient voltage burst limits to be

applied through 100pF on VDD and VDD

pins to induce a functional disturbance

VDD=5V, TA=+25°C, fOSC=8MHz

conforms to IEC 1000-4-4

Table 77.

Emission test

Symbol Parameter

Conditions

Monitored

Frequency Band

Max vs. [fOSC/fCPU]Unit

8/4MHz

16/8MHz

−

SEMI

Peak level

VDD=5V, TA=+25°C,

SO20 package,

conforming to SAE J 1752/3

0.1 MHz to 30 MHz

μV

30 MHz to 130 MHz

130 MHz to 1 GHz

SAE EMI Level

3.5

−

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