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ST7LITE20F2 数据表(PDF) 134 Page - STMicroelectronics |
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ST7LITE20F2 数据表(HTML) 134 Page - STMicroelectronics |
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134 / 166 page ![]() Electrical characteristics ST7LITE20F2 ST7LITE25F2 ST7LITE29F2 134/166 Doc ID 8349 Rev 5 Figure 67. Two typical applications with unused I/O Pin Caution: To avoid entering ICC mode unexpectedly during a reset, the ICCCLK pin must be pulled-up internally or externally during normal operation (external pull-up of 10k mandatory in noisy environment). Note: I/O can be left unconnected if it is configured as output (0 or 1) by the software. This has the advantage of greater EMC robustness and lower cost. Figure 68. Typical IPU vs. VDD with VIN=VSS tf(IO)out Output high to low level fall time(2) CL=50pF Between 10% and 90% − 25 − ns tr(IO)out Output low to high level rise time(2) − 25 − tw(IT)in External interrupt pulse time(5) − 1 −− tCPU 1. Subject to general operating conditions for VDD, fOSC, and TA unless otherwise specified. 2. Data based on characterization results, not tested in production. 3. Configuration not recommended, all unused pins must be kept at a fixed voltage: using the output mode of the I/O for example or an external pull-up or pull-down resistor (seeFigure 67). Static peak current value taken at a fixed VIN value, based on design simulation and technology characteristics, not tested in production. This value depends on VDD and temperature values. 4. The RPU pull-up equivalent resistor is based on a resistive transistor (corresponding IPU current characteristics described in Figure 68). 5. To generate an external interrupt, a minimum pulse width has to be applied on an I/O port pin configured as an external interrupt source. Table 80. General Characteristics(1) (continued) Symbol Parameter Conditions Min Typ Max Unit 10k Ω UNUSED I/O PORT ST7XXX 10k Ω UNUSED I/O PORT ST7XXX VDD 0 10 20 30 40 50 60 70 80 90 22.5 33 .5 4 4.5 55.5 6 Vdd(V) Ta=1 40°C Ta=9 5°C Ta=2 5°C Ta=-45 °C |
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