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TNETX3150 数据表(PDF) 75 Page - Texas Instruments

部件名 TNETX3150
功能描述  ThunderSWITCHE 15-PORT 10-/100-MBIT/S ETHERNETE SWITCH
PDF  113 Pages
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

TNETX3150 数据表(HTML) 75 Page - Texas Instruments

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TNETX3150/TNETX3150A
ThunderSWITCH15-PORT 10-/100-MBIT/S ETHERNETSWITCH
SPWS027F – FEBRUARY 1997 – REVISED SEPTEMBER 1997
75
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
secondary test access: internal RAM access modes
When implementing an architecture that employs embedded RAM structures, it is necessary to ensure test
access over and above JTAG connectivity testing through standard interfacing. The DIO interface used by the
TNETX3150/TNETX3150A
enables
the
user
to
interrogate
the
internal
RAMS
of
the
TNETX3150/TNETX3150A. User interrogation gives the required observability for the RAM and the data they
contain.
RAM test access is desirable at all levels of testing:
Silicon production level that enables detection of defective devices
System production level that permits diagnostic testing
Field level that permits diagnostics and debugging
FIFO RAM test access
FIFO RAM access for test is provided through the DIO interface. This allows full RAM access for RAM testing
purposes. Access to the FIFO shall be allowed only following a soft reset and before the START bit is written
(or after power up and before the START bit is written). The soft reset bit should be set, then immediately reset.
If the soft reset bit is not cleared, the TNETX3150/TNETX3150A holds the DRAM refresh logic operation in reset
and the contents of the external memory becomes invalid.
To access the FIFO RAM from the DIO, bytes are written to a holding latch that is the width of the RAM word
(72 bits). When a byte is accessed, the whole word is updated in RAM. If the same pattern is to be loaded
throughout the memory, it requires only a new FIFO RAM address for setup between accesses on a single byte
within the word. The data in the latch does not change (i.e., a read /modify/write is not performed).
structure (statistics) RAM test access
Test access to the statistics RAM is provided through the DIO port after the TNETX3150/TNETX3150A is soft
reset (or following power up before the start bit is set). In this mode, all locations of the RAM can be written to
and read from. Once the start bit is set, only read access is permitted to the RAM. When asserting soft reset,
it is important to reset the soft reset bit immediately after setting it. This ensures that the DRAM refresh logic
operation is not held at reset. If held at reset, normal DRAM refreshes fail to occur, and the DRAM contents
become invalid.
To access the structure RAM from the DIO, bytes are written to a holding latch that is the width of the RAM word
(64 bits). When a byte is accessed, the whole word is updated in RAM. If the same pattern is loaded throughout
the memory, it requires only a new structure RAM address for setup between accesses on a single byte within
the word. The data in the latch does not change (i.e., a read/modify/write is not performed).



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