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TNETX3150 数据表(PDF) 79 Page - Texas Instruments

部件名 TNETX3150
功能描述  ThunderSWITCHE 15-PORT 10-/100-MBIT/S ETHERNETE SWITCH
PDF  113 Pages
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

TNETX3150 数据表(HTML) 79 Page - Texas Instruments

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TNETX3150/TNETX3150A
ThunderSWITCH15-PORT 10-/100-MBIT/S ETHERNETSWITCH
SPWS027F – FEBRUARY 1997 – REVISED SEPTEMBER 1997
79
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
tertiary test access
The internal RAM access infers only that both DIO port and internal RAM structures are functioning correctly.
It does not provide information on the TNETX3150/TNETX3150A data paths (to and from the RAMS) during
normal frame operations or an indication of the control path functionality. To further assist with this, the proposed
tests are as follows:
DRAM access — this test proves that the data path between FIFO and DRAM is functioning, along with
certain sections of the queue manager and FIFO logic operations.
Frame forwarding — frame data is forwarded from one port to the next using a loop-back mode. This
builds on the previous tests, and tests that the data path to and from the protocol handlers and control
paths are operational. The number of ports that take part in forwarding is controlled using the VLAN
registers, allowing any number of ports to be tested in this mode. Single connections can be tested
allowing individual protocol-handler data paths-to-FIFO connections to be tested or multiple port testing
that allows reduced system test time.
external DRAM test access
Using the incremental test approach (after the FIFO is tested and verified), the data path to and control of the
external DRAM memory is verified.
DRAM writes are carried out by first constructing a buffer in the FIFO (64 bytes), and then initiating a buffer write
from the FIFO to the DRAM. The buffer is transferred like a normal buffer transfer in a 17-write DRAM burst.
The forward pointer field is mapped to the DRAM data register, and the flag data fields are mapped to the DRAM
flag register.
Reading from the DRAM performs a buffer transfer to the FIFO from which individual bytes can be read (and
tested) through the DIO interface. The flag bytes and forward-pointer bytes are transferred from the DRAM to
the DRAM-data and DRAM-flag registers for reading.
The buffer transfer mechanism, when operated in DRAM test access mode, does not check the flag status. No
actions are performed, depending on the status of the flags. The transfer is a test data transfer, with no attempt
made to comprehend flag contents.
After completion of the DRAM testing, the TNETX3150/TNETX3150A should be reset before normal switching
activity is resumed. This ensures that the TNETX3150/TNETX3150A is returned to a defined state before
normal functionality is resumed. This mechanism is primarily intended for DRAM testing and is not a part of a
breakpoint/debug mechanism.
For more information refer to the
test register section.



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