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SPC560P34L1 数据表(PDF) 80 Page - STMicroelectronics |
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SPC560P34L1 数据表(HTML) 80 Page - STMicroelectronics |
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80 / 103 page ![]() Electrical characteristics SPC560P34L1, SPC560P34L3, SPC560P40L1, SPC560P40L3 80/103 Doc ID 16100 Rev 7 3.17.2 IEEE 1149.1 interface timing Figure 22. JTAG test clock input timing 4. CL includes device and package capacitance (CPKG <5 pF). 5. The configuration PAD3V5 = 1 when VDD = 5 V is only transient configuration during power-up. All pads but RESET and Nexus output (MDOx, EVTO, MCKO) are configured in input or in high impedance state. Table 38. JTAG pin AC electrical characteristics No . Symbol C Parameter Conditions Value Unit Min Max 1tJCYC CC D TCK cycle time — 100 — ns 2tJDC CC D TCK clock pulse width (measured at VDD_HV_IOx/2) — 40 60 ns 3tTCKRISE CC D TCK rise and fall times (40%–70%) — — 3 ns 4tTMSS, tTDIS CC D TMS, TDI data setup time — 5 — ns 5 tTMSH, tTDIH CC D TMS, TDI data hold time — 25 — ns 6tTDOV CC D TCK low to TDO data valid — — 40 ns 7tTDOI CC D TCK low to TDO data invalid — 0 — ns 8tTDOHZ CC D TCK low to TDO high impedance — 40 — ns 9tBSDV CC D TCK falling edge to output valid — — 50 ns 10 tBSDVZ CC D TCK falling edge to output valid out of high impedance — — 50 ns 11 tBSDHZ CC D TCK falling edge to output high impedance — — 50 ns 12 tBSDST CC D Boundary scan input valid to TCK rising edge — 50 — ns 13 tBSDHT CC D TCK rising edge to boundary scan input invalid — 50 — ns TCK 1 2 2 3 3 |
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