SPC560P34L1 datasheet(45/103 Pages) STMICROELECTRONICS

45 / 103 page

SPC560P34L1, SPC560P34L3, SPC560P40L1, SPC560P40L3

Electrical characteristics

Doc ID 16100 Rev 7

45/103

Electrical characteristics

3.1

Introduction

This section contains device electrical characteristics as well as temperature and power

considerations.

This microcontroller contains input protection against damage due to high static voltages.

However, it is advisable to take precautions to avoid application of any voltage higher than

the specified maximum rated voltages.

To enhance reliability, unused inputs can be driven to an appropriate logic voltage level (VDD

or VSS). This can be done by the internal pull-up or pull-down resistors, which are provided

by the device for most general purpose pins.

The following tables provide the device characteristics and its demands on the system.

In the tables where the device logic provides signals with their respective timing

characteristics, the symbol “CC” for Controller Characteristics is included in the Symbol

column.

In the tables where the external system must provide signals with their respective timing

characteristics to the device, the symbol “SR” for System Requirement is included in the

Symbol column.

Caution:

All of the following parameter values can vary depending on the application and must be

confirmed during silicon characterization or silicon reliability trial.

3.2

Parameter classification

The electrical parameters are guaranteed by various methods. To give the customer a better

understanding, the classifications listed in Table 8 are used and the parameters are tagged

accordingly in the tables where appropriate.

Note:

The classification is shown in the column labeled “C” in the parameter tables where

appropriate.

Table 8.

Parameter classifications

Classification tag

Tag description

Those parameters are guaranteed during production testing on each individual device.

Those parameters are achieved by the design characterization by measuring a statistically

relevant sample size across process variations.

Those parameters are achieved by design characterization on a small sample size from

typical devices under typical conditions unless otherwise noted. All values shown in the typical

column are within this category.

Those parameters are derived mainly from simulations.

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