LSM6DSTX datasheet(11/175 Pages) STMICROELECTRONICS

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Symbol

Parameter

Test conditions

Min.

Typ.(1)

Max.

Unit

RMS

Acceleration RMS noise in normal/low-power mode(8)(9)

FS = ±16 g

mg(RMS)

3.0

Acceleration RMS noise in ultralow-power mode(8)(9)

FS = ±2 g

5.5

LA_ODR

Linear acceleration output data rate

1.6(10)

12.5

104

208

416

833

1666

3332

6664

G_ODR

Angular rate output data rate

12.5

104

208

416

833

1666

3332

6664

Vst

Linear acceleration self-test output change(11)(12)(13)

1700

Angular rate self-test output change(14)(15)

FS = ±250 dps

dps

FS = ±2000 dps

150

700

dps

Top

Operating temperature range

-40

+85

°C

1. Typical specifications are not guaranteed.

2. Sensitivity values after factory calibration test and trimming.

3. Value after calibration.

4. Measurements are performed in a uniform temperature setup and they are based on characterization data in a limited number of samples.

Not measured during final test for production.

5. Gyroscope rate noise density in high-performance mode is independent of the ODR and FS setting.

6. Gyroscope RMS noise in normal/low-power mode is independent of the ODR and FS setting.

7. Accelerometer noise density in high-performance mode is independent of the ODR.

8. Accelerometer RMS noise in normal/low-power/ultralow-power mode is independent of the ODR.

9. Noise RMS related to BW = ODR/2.

10. This ODR is available when the accelerometer is in low-power mode.

11. The sign of the linear acceleration self-test output change is defined by the STx_XL bits in a dedicated register for all axes.

12. The linear acceleration self-test output change is defined with the device in stationary condition as the absolute value of:OUTPUT[LSb]

(self-test enabled) - OUTPUT[LSb] (self-test disabled). 1LSb = 0.061 mg at ±2 g full scale.

13. Accelerometer self-test limits are full-scale independent.

14. The sign of the angular rate self-test output change is defined by the STx_G bits in a dedicated register for all axes.

15. The angular rate self-test output change is defined with the device in stationary condition as the absolute value of:OUTPUT[LSb] (self-test

enabled) - OUTPUT[LSb] (self-test disabled). 1LSb = 70 mdps at ±2000 dps full scale.

LSM6DSTX

Mechanical characteristics

DS14039 - Rev 1

page 11/175

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