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TMP86FS49AIUG 数据表(PDF) 291 Page - Toshiba Semiconductor |
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TMP86FS49AIUG 数据表(HTML) 291 Page - Toshiba Semiconductor |
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291 / 296 page ![]() Page 275 TMP86FS49AIUG 23. Reference evaluation information As a reference, Toshiba conducted ESD immunity test for TMP86FS49AIUG by Charged Device Model (CDM) in addition to Machine Model (MM) and Human Body Model (HBM). The following is a result. Used Model : CDM Immunity positive voltatge : more than 500V, negative voltage : more than 500V Notice: This data does not mean a warranty for the immunity. Therefore Toshiba would like to ask a customer to handle it as a reference. If there are any questions, please contact us through our sales representative. |
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