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ADE7932 数据表(PDF) 43 Page - Analog Devices

部件名 ADE7932
功能描述  Isolated Energy Metering Chipset for Polyphase Shunt Meters
PDF  120 Pages
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网页  http://www.analog.com
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ADE7932 数据表(HTML) 43 Page - Analog Devices

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Data Sheet
ADE7978/ADE7933/ADE7932
Rev. 0 | Page 43 of 120
If a ZXTOIx or ZXTOVx bit (any of Bits[8:3]) is set in the
MASK1 register, the IRQ1 interrupt pin is driven low when the
corresponding status bit is set to 1. The status bit is cleared and
the IRQ1 pin returns high when a 1 is written to the appropriate
bit in the STATUS1 register.
The resolution of the ZXTOUT register is 62.5 μs (16 kHz clock)
per LSB. Thus, the maximum timeout period for an interrupt is
4.096 sec, that is, 216/16 kHz. Note that because the timer starts
to decrement 1 ms after a zero-crossing event is triggered, the
value of the ZXTOUT register is
ZXTOUT = Desired ZX Timeout × 16 kHz − 16
(14)
Figure 54 shows the mechanism of zero-crossing timeout
detection when the voltage or current signal stays at a fixed
dc level for more than 62.5 μs × ZXTOUT μs.
16-BIT INTERNAL
REGISTER VALUE
ZXTOUT
VOLTAGE
OR
CURRENT
SIGNAL
IRQ1 INTERRUPT PIN
ZXTOxy FLAG IN
STATUS1[31:0], x = V, I,
y = A, B, C
0V
Figure 54. Zero-Crossing Timeout Detection
When the phase voltage is 0, noise in the voltage measurement
can trigger spurious zero-crossing events that may nullify the
action of the ZX timeout. A threshold 1000 times lower than full
scale is implemented in conjunction with this circuit. If the peak
of the phase voltage is below this threshold, the ZX timeout
counter begins to decrement automatically.
Phase Sequence Detection
The ADE7978 has on-chip phase sequence error detection circuits.
This detection works on phase voltages and considers only the
zero crossings determined by their negative to positive transitions.
The regular succession of these zero-crossing events is Phase A
followed by Phase B followed by Phase C (see Figure 55).
ZX C
ZX B
PHASE B
PHASE C
PHASE A
ZX A
Figure 55. Regular Succession of Zero-Crossing Events:
Phase A, Phase B, and Phase C
If the sequence of zero-crossing events is, instead, Phase A
followed by Phase C followed by Phase B, then Bit 19 (SEQERR)
in the STATUS1 register is set. If Bit 19 (SEQERR) in the MASK1
register is set to 1 and a phase sequence error event is triggered,
the IRQ1 interrupt pin is driven low. The status bit is cleared and
the IRQ1 pin returns high when a 1 is written to Bit 19 (SEQERR)
in the STATUS1 register.
The phase sequence error detection circuit is functional only
when the ADE7978/ADE7933/ADE7932 chipset is connected
in a 3-phase, 4-wire, three voltage sensor configuration (Bits[5:4],
CONSEL[1:0], in the ACCMODE register at Address 0xE701 are
set to 00). In all other configurations, only two voltage sensors
are used; therefore, it is not recommended to use the detection
circuit. In these configura-tions, use the time intervals between
phase voltages to analyze the phase sequence (see the Time
Interval Between Phases section).
Figure 56 shows an example of the Phase A voltage followed by
the Phase C voltage instead of the Phase B voltage. After this error
occurs, Bit 19 (SEQERR) in the STATUS1 register is set to 1
every time a negative to positive zero crossing occurs.
ZX B
ZX C
PHASE C
PHASE B
PHASE A
A, B, C PHASE
VOLTAGES AFTER
LPF1
BIT 19 (SEQERR) IN
STATUS1 REGISTER
IRQ1
ZX A
STATUS1[19] SET TO 1
STATUS1[19] CANCELLED
BY A WRITE TO
STATUS1 REGISTER WITH
SEQERR BIT SET
Figure 56. SEQERR Bit Set to 1 When Phase A Voltage Is Followed by
Phase C Voltage
After a phase sequence error is detected, the time measurement
between various phase voltages can help to identify which phase
voltage should be combined with another phase current in the
computational datapath (see the Time Interval Between Phases
section). Bits[9:8] (VTOIA[1:0]), Bits[11:10] (VTOIB[1:0]), and
Bits[13:12] (VTOIC[1:0]) in the CONFIG register (Address 0xE618)
can be used to direct one phase voltage to the datapath of another
phase (see the Changing the Phase Voltage Datapath section for
more information).



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