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LPC802 数据表(PDF) 36 Page - NXP Semiconductors |
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LPC802 数据表(HTML) 36 Page - NXP Semiconductors |
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36 / 83 page ![]() LPC802 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2018. All rights reserved. Product data sheet Rev. 1.6 — 27 April 2018 36 of 83 NXP Semiconductors LPC802 32-bit ARM Cortex-M0+ microcontroller 9.24 Emulation and debugging Debug functions are integrated into the ARM Cortex-M0+. Serial wire debug functions are supported in addition to a standard JTAG boundary scan. The ARM Cortex-M0+ is configured to support up to four breakpoints and two watch points. The RESET pin selects between the JTAG boundary scan (RESET = LOW) and the ARM SWD debug (RESET = HIGH). The ARM SWD debug port is disabled while the LPC802 is in reset. The JTAG boundary scan pins are selected by hardware when the part is in boundary scan mode. See Table 4. To perform boundary scan testing, follow these steps: 1. Erase any user code residing in flash. 2. Power up the part with the RESET pin pulled HIGH externally. 3. Wait for at least 250 s. 4. Pull the RESET pin LOW externally. 5. Perform boundary scan operations. 6. Once the boundary scan operations are completed, assert the TRST pin to enable the SWD debug mode, and release the RESET pin (pull HIGH). Remark: The JTAG interface cannot be used for debug purposes. |
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