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EDBA164B4PR-1DITF-R 数据表(PDF) 145 Page - Micron Technology |
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EDBA164B4PR-1DITF-R 数据表(HTML) 145 Page - Micron Technology |
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145 / 152 page ![]() Data Setup, Hold, and Slew Rate Derating For all input signals (DQ, DM) the total required setup time (tDS) and hold time (tDH) are calculated by adding the data sheet tDS(base) and tDH(base) values (see the follow- ing table) to the ΔtDS and ΔtDH derating values, respectively (see the following derating tables). Example: tDS = tDS(base) + ΔtDS. The typical tDS slew rate for a rising signal is defined as the slew rate between the last crossing of VREF(DC) and the first crossing of VIH(AC)min. The typical tDS slew rate for a falling signal is defined as the slew rate between the last crossing of VREF(DC) and the first crossing of VIL(AC)max (see the Typical Slew Rate and tVAC – tDS for DQ Relative to Strobe figure). If the actual signal is consistently earlier than the typical slew rate line in the figure, "Typical Slew Rate and tVAC – tIS for CA and CS_n Relative to Clock (CA and CS_n Setup, Hold, and Derating), the area shaded gray between the VREF(DC) region and the AC re- gion, use the typical slew rate for the derating value. If the actual signal is later than the typical slew rate line anywhere between the shaded VREF(DC) region and the AC region, the slew rate of a tangent line to the actual signal from the AC level to the DC level is used for the derating value (see figure "Tangent Line – tIS for CA and CS_n Relative to Clock" in CA and CS_n Setup, Hold, and Derating). The typical tDH slew rate for a rising signal is defined as the slew rate between the last crossing of VIL(DC)max and the first crossing of VREF(DC). The typical tDH slew rate for a falling signal is defined as the slew rate between the last crossing of VIH(DC)min and the first crossing of VREF(DC) (see the Typical Slew Rate – DH for DQ Relative to Strobe fig- ure). If the actual signal is consistently later than the typical slew rate line between the shaded DC-level-to-VREF(DC) region, the typical slew rate should be used for the derating value. If the actual signal is earlier than the typical slew rate line anywhere between sha- ded DC-to-VREF(DC) region, the slew rate of a tangent line to the actual signal from the DC level to the VREF(DC) level is used for the derating value (see the Tangent Line – tDH for DQ with Respect to Strobe figure). For a valid transition, the input signal must remain above or below VIH/VIL(AC) for the specified time, tVAC (see the Required Time for Valid Transition – tVAC > VIH(AC) or < VIL(AC) table). The total setup time for slow slew rates could be negative; that is, a valid input signal may not have reached VIH/VIL(AC) at the time of the rising clock transition. A valid input signal is still required to complete the transition and reach VIH/VIL(AC). For slew rates between the values listed in the following tables, the derating values can be obtained using linear interpolation. Typically, slew rate values are not subject to pro- duction testing. They are verified by design and characterization. Table 97: Data Setup and Hold Base Values (>400 MHz, 1 V/ns Slew Rate) Parameter Data Rate Reference 1066 933 800 667 533 466 tDS (base) -10 15 50 130 210 230 VIH/VIL(AC) = VREF(DC) ±220mV 216-Ball and 220-Ball, Dual-Channel LPDDR2 SDRAM Data Setup, Hold, and Slew Rate Derating 09005aef85eb530a 216b_220b_2ch_2e0e_embedded_lpddr2.pdf – Rev. F 08 /16 EN 145 Micron Technology, Inc. reserves the right to change products or specifications without notice. © 2014 Micron Technology, Inc. All rights reserved. |
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