ADE5166 datasheet(70/148 Pages) AD

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ADE5166/ADE5169/ADE5566/ADE5569

Preliminary Technical Data

Rev. PrB | Page 70 of 148

TEMPERATURE MEASUREMENT

To provide a digital temperature measurement, each ADE5166/

ADE5169/ADE5566/ADE5569 includes a dedicated ADC. An

8-bit temperature ADC value SFR (TEMPADC, 0xD7) holds

the results of the temperature conversion. The resolution of the

temperature measurement is 0.78°C/LSB. There are two ways to

initiate a temperature conversion: a single temperature measure-

ment or background temperature measurements.

Single Temperature Measurement

Set the TEMP_ADC_GO bit in the start ADC measurement

SFR (ADCGO, 0xD8) to obtain a temperature measurement

(see Table 51). An interrupt is generated when the conversion is

complete and when the temperature measurement is available

in the temperature ADC value SFR (TEMPADC, 0xD7).

Background Temperature Measurements

Background temperature measurements are disabled by default.

To configure the background temperature measurement mode,

set a temperature measurement interval in the peripheral ADC

strobe period SFR (STRBPER, 0xF9). Temperature measurements

are then performed periodically in the background (see Table 49).

When a temperature conversion completes, the new temperature

ADC value is compared to the last temperature ADC value that

created an interrupt. If the absolute difference between the two

values is greater than the setting in the TEMP_DIFF[2:0] bits in

the temperature and supply delta SFR (DIFFPROG, 0xF3), a

TEMPADC interrupt is generated (see Table 50). This allows

temperature measurements to take place completely in the

background, only requiring MCU activity if the temperature

changes more than a configurable delta.

To set up background temperature measurements, follow

these steps:

Initiate a single temperature measurement by setting the

TEMP_ADC_GO bit in the start ADC measurement SFR

(ADCGO, 0xD8).

Upon completion of this measurement, configure the

TEMP_DIFF[2:0] bits to establish the change in temperature

that triggers an interrupt.

Set up the interval for background temperature measurements

by configuring the TEMP_PERIOD[1:0] bits in the

peripheral ADC strobe period SFR (STRBPER, 0xF9).

Temperature ADC in PSM0, PSM1, and PSM2

Depending on the operating mode of the ADE5166/ADE5169/

ADE5566/ADE5569, a temperature conversion is initiated only

by certain actions.

•

In PSM0 operating mode, the 8052 is active. Temperature

measurements are available in the background measurement

mode and by initiating a single measurement.

•

In PSM1 operating mode, the 8052 is active and the part

is battery powered. Single temperature measurements

can be initiated by setting the TEMP_ADC_GO bit in the

start ADC measurement SFR (ADCGO, 0xD8).

Background temperature measurements are not available.

•

In PSM2 operating mode, the 8052 is not active.

Temperature conversions are available through the

background measurement mode only.

The temperature ADC value SFR (TEMPADC, 0xD7) is updated

with a new value only when a temperature ADC interrupt occurs.

Temperature ADC Interrupt

The temperature ADC can generate an ADC interrupt when at

least one of the following conditions occurs:

•

The difference between the new temperature ADC value and

the last temperature ADC value generating an ADC interrupt

is larger than the value set in the TEMP_DIFF[2:0] bits.

•

The temperature ADC conversion, initiated by setting start

ADC measurement SFR (ADCGO, 0xD8) finishes.

When the ADC interrupt occurs, a new value is available in the

temperature ADC value SFR (TEMPADC, 0xD7). Note that

there is no flag associated with this interrupt.

BATTERY MEASUREMENT

To provide a digital battery measurement, each ADE5166/

ADE5169/ADE5566/ADE5569 includes a dedicated ADC. The

battery measurement is available in an 8-bit SFR, the battery

ADC value SFR (BATADC, 0xDF). The battery measurement

has a resolution of 14.6 mV/LSB. A battery conversion can be

initiated by two methods: a single battery measurement or

background battery measurements.

Single Battery Measurement

Set the BATT_ADC_GO bit in the start ADC measurement

SFR (ADCGO, 0xD8) to obtain a battery measurement. An

interrupt is generated when the conversion is done and when

the battery measurement is available in the battery ADC value

SFR (BATADC, 0xDF).

Background Battery Measurements

To configure background measurements for the battery, establish a

measurement interval in the peripheral ADC strobe period SFR

(STRBPER, 0xF9). Battery measurements are then performed

periodically in the background (see Table 49).

When a battery conversion completes, the battery ADC value is

compared to the low battery threshold, established in the battery

detection threshold SFR (BATVTH, 0xFA). If the battery ADC

value is below this threshold, a low battery flag is set. This low

battery flag is the FBAT bit in the power management interrupt

flag SFR (IPSMF, 0xF8), which is used for power supply manage-

ment. This low battery flag can be enabled to generate the PSM

interrupt by setting the EBAT bit in the power management

interrupt enable SFR (IPSME, 0xEC). This method allows battery

measurements to take place completely in the background, only

requiring MCU activity if the battery drops below a user-specified

threshold.

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