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LTM4686BIVPBF 数据表(PDF) 63 Page - Analog Devices |
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LTM4686BIVPBF 数据表(HTML) 63 Page - Analog Devices |
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63 / 130 page ![]() LTM4686B 63 Rev. 0 For more information www.analog.com APPLICATIONS INFORMATION joints and through a portion of the board. The board temperature is measured a specified distance from the package, using a two sided, two layer board. This board is described in JESD51-9. A graphical representation of the aforementioned ther- mal resistances is given in Figure 9; blue resistances are contained within the µModule regulator, whereas green resistances are external to the µModule package. As a practical matter, it should be clear to the reader that no individual or sub-group of the four thermal resistance parameters defined by JESD51-12 or provided in the Pin Configuration section replicates or conveys normal oper- ating conditions of a µModule regulator. For example, in normal board-mounted applications, never does 100% of the device’s total power loss (heat) thermally conduct exclusively through the top or exclusively through bot- tom of the µModule package—as the standard defines for θJCtop and θJCbottom, respectively. In practice, power loss is thermally dissipated in both directions away from the package—granted, in the absence of a heat sink and airflow, a majority of the heat flow is into the board. Within the LTM4686B, be aware there are multiple power devices and components dissipating power, with a con- sequence that the thermal resistances relative to differ- ent junctions of components or die are not exactly linear with respect to total package power loss. To reconcile this complication without sacrificing modeling simplic- ity—but also not ignoring practical realities—an approach has been taken using FEA software modeling along with laboratory testing in a controlled-environment chamber to reasonably define and correlate the thermal resistance values supplied in this data sheet: (1) Initially, FEA software is used to accurately build the mechanical geometry of the LTM4686B and the specified PCB with all of the cor- rect material coefficients along with accurate power loss source definitions; (2) this model simulates a software- defined JEDEC environment consistent with JESD51-9 and JESD51-12 to predict power loss heat flow and tempera- ture readings at different interfaces that enable the cal- culation of the JEDEC-defined thermal resistance values; (3) the model and FEA software is used to evaluate the LTM4686B with heat sink and airflow; (4) having solved for and analyzed these thermal resistance values and simu- lated various operating conditions in the software model, a thorough laboratory evaluation replicates the simulated conditions with thermocouples within a controlled envi- ronment chamber while operating the device at the same power loss as that which was simulated. The outcome of this process and due diligence yields the set of derating curves provided in later sections of this data sheet, along with well-correlated JESD51-12-defined θ values provided in the Pin Configuration section of this data sheet. 4686B F09 µModule DEVICE JUNCTION-TO-CASE (TOP) RESISTANCE CASE (TOP)-TO-AMBIENT RESISTANCE BOARD-TO-AMBIENT RESISTANCE JUNCTION-TO-CASE (BOTTOM) RESISTANCE JUNCTION AMBIENT Figure 9. Graphical Representation of JESD51-12 Thermal Coefficients |
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