JS28F256P33BFE datasheet(48/90 Pages) MICRON

部件名	JS28F256P33BFE

功能描述	NumonyxTM StrataFlash Embedded Memory

PDF	90 Pages

Scroll/Zoom	100%

制造商	MICRON [Micron Technology]

网页	http://www.micron.com

标志

48 / 90 page

P33-65nm

Datasheet

Aug 2009

Order Number: 320003-08

15.0

AC Characteristics

15.1

AC Test Conditions

Note:

AC test inputs are driven at VCCQ for Logic "1" and 0 V for Logic "0." Input/output timing begins/ends at VCCQ/2. Input

rise and fall times (10% to 90%) < 5 ns. Worst-case speed occurs at VCC = VCCMin.

Notes:

See the following table for component values.

Test configuration component value for worst case speed conditions.

CL includes jig capacitance

Figure 14: AC Input/Output Reference Waveform

Figure 15: Transient Equivalent Testing Load Circuit

Table 21: Test Configuration Component Value for Worst Case Speed Conditions

Test Configuration

CL (pF)

VCCQ Min Standard Test

Figure 16: Clock Input AC Waveform

IO_REF.WMF

Input V

CCQ/2

CCQ/2 Output

CCQ

Test Points

Device

Under Test

Out

CLK [C]

R203

R202

R201

JS28F256P33BFE 数据表(PDF) 48 Page - Micron Technology

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