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PC87366 数据表(PDF) 232 Page - National Semiconductor (TI) |
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PC87366 数据表(HTML) 232 Page - National Semiconductor (TI) |
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232 / 240 page ![]() 14.0 Device Characteristics (Continued) 232 www.national.com 14.5 AC ELECTRICAL CHARACTERISTICS 14.5.1 AC Test Conditions Figure 49. AC Test Conditions, TA =0 °Cto70 °C, VDD = 5.0 V ±10% Notes: 1. CL = 100 pF for all output except OPCI, and CL= 50pF for outputs of type OPCI, this includes jig and scope capacitance. 2. S1 = Open for push-pull output pins. S1 = VDD for high impedance to active low and active low to high impedance measurements. S1 = GND for high impedance to active high and active high to high impedance measurements. RL = 1.0KΩ for µP interface pins. 3. For the FDC open-drive interface pins, S1 = VDD and RL = 150Ω. 14.5.2 Clock Timing . Symbol Parameter 48 MHz Min Max Unit tCH Clock High Pulse WidthNote 1. Note 1. Not tested. Guaranteed by design. 8.4 ns tCL Clock Low Pulse WidthNote 1. 8.4 ns tCP Clock Period Note 1. 20 21.5 ns Device Under Test 0.1 µf Input Output RL CL S1 Load Circuit (Notes 1, 2, 3) AC Testing Input, Output Waveform VDD 2.4 0.4 2.0 0.8 Test Points 2.0 0.8 CLKIN tCL tCP tCH |
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