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VSC8540RT 数据表(PDF) 80 Page - Microchip Technology |
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VSC8540RT 数据表(HTML) 80 Page - Microchip Technology |
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80 / 87 page ![]() VSC8540RT DS60001603E-page 80 2022 Microchip Technology Inc. and its subsidiaries 9.1.1 MARKING Top marking follows the example shown below: Where: Line 1 = Microchip Logo Line 2 and 3 = Device Name Line 4 = Traceability Code 9.1.2 THERMAL SPECIFICATIONS Thermal specifications for this device are based on the JEDEC JESD51 family of documents. These documents are available on the JEDEC website at www.jedec.org. The thermal specifications are modeled using a four-layer test board with two signal layers, a power plane, and a ground plane (2s2p PCB). For more information about the thermal mea- surement method used for this device, see the JESD51-1 standard. To achieve results similar to the modeled thermal measurements, the guidelines for board design described in the JESD51 family of publications must be applied. For information about applications using VQFN packages, see the fol- lowing: • JESD51-2A, Integrated Circuits Thermal Test Method Environmental Conditions, Natural Convection (Still Air) • JESD51-6, Integrated Circuit Thermal Test Method Environmental Conditions, Forced Convection (Moving Air) • JESD51-8, Integrated Circuit Thermal Test Method Environmental Conditions, Junction-to-Board • JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages • JESD51-5, Extension of Thermal Test Board Standards for Packages with Direct Thermal Attachment Mecha- nisms 9.1.3 MOISTURE SENSITIVITY 9.1.4 This device is rated moisture sensitivity level 3 or better as specified in the joint IPC and JEDEC standard IPC/JEDEC J-STD-020. For more information, see the IPC and JEDEC standard. 9.2 68-Pin Ceramic Quad Flat Package The package is a lead-free (Pb-free), 68-pin, Ceramic Quad Flat Package (CQFP) with a heat slug, 13.05 mm × 13.05 mm body size, 0.635 mm pin pitch and 3.68 mm maximum height. The heat slug used for ground has the same size as the exposed pad of the VQFN68. The package lid is connected to ground. TABLE 9-1: THERMAL RESISTANCES Symbol °C/W Parameter JB 5.6 Die junction to printed circuit board (vacuum environment) JA 26.6 Die junction to ambient (air environment) JMA at 1 m/s 20.0 Die junction to moving air measured at an air speed of 1 m/s JMA at 2 m/s 19.0 Die junction to moving air measured at an air speed of 2 m/s |
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