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TMS320F2811 数据表(PDF) 21 Page - Texas Instruments |
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TMS320F2811 数据表(HTML) 21 Page - Texas Instruments |
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21 / 173 page ![]() Introduction 21 April 2001 − Revised July 2007 SPRS174O Table 2−2. Signal Descriptions† (Continued) NAME DESCRIPTION PU/PD§ I/O/Z‡ PIN NO. NAME DESCRIPTION PU/PD§ I/O/Z‡ 128-PINP BK 176-PINP GF 179-PING HH JTAG (CONTINUED) EMU0 D11 137 100 I/O/Z PU Emulator pin 0. When TRST is driven high, this pin is used as an interrupt to or from the emulator system and is defined as input/output through the JTAG scan. This pin is also used to put the device into boundary-scan mode. With the EMU0 pin at a logic-high state and the EMU1 pin at a logic-low state, a rising edge on the TRST pin would latch the device into boundary-scan mode. NOTE: An external pullup resistor is recommended on this pin. The value of this resistor should be based on the drive strength of the debugger pods applicable to the design. A 2.2-k Ω to 4.7-kΩ resistor is generally adequate. Since this is application-specific, it is recommended that each target board be validated for proper operation of the debugger and the application. EMU1 C9 146 105 I/O/Z PU Emulator pin 1. When TRST is driven high, this pin is used as an interrupt to or from the emulator system and is defined as input/output through the JTAG scan. This pin is also used to put the device into boundary-scan mode. With the EMU0 pin at a logic-high state and the EMU1 pin at a logic-low state, a rising edge on the TRST pin would latch the device into boundary-scan mode. NOTE: An external pullup resistor is recommended on this pin. The value of this resistor should be based on the drive strength of the debugger pods applicable to the design. A 2.2-k Ω to 4.7-kΩ resistor is generally adequate. Since this is application-specific, it is recommended that each target board be validated for proper operation of the debugger and the application. ADC ANALOG INPUT SIGNALS ADCINA7 B5 167 119 I ADCINA6 D5 168 120 I ADCINA5 E5 169 121 I 8-Channel analog inputs for Sample-and-Hold A. ADCINA4 A4 170 122 I 8-Channel analog inputs for Sample-and-Hold A. The ADC pins should not be driven before VDDA1, ADCINA3 B4 171 123 I The ADC pins should not be driven before VDDA1, VDDA2, andVDDAIO pins have been fully powered up. ADCINA2 C4 172 124 I VDDA2, andVDDAIO pins have been fully powered up. ADCINA1 D4 173 125 I ADCINA0 A3 174 126 I † Typical drive strength of the output buffer for all pins is 4 mA except for TDO, XCLKOUT, XF, XINTF, EMU0, and EMU1 pins, which are 8 mA. ‡ I = Input, O = Output, Z = High impedance § PU = pin has internal pullup; PD = pin has internal pulldown. Pullup/pulldown strength is given in Section 6.3. The pullups/pulldowns are enabled in boundary scan mode. |
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