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LTC6953 数据表(PDF) 46 Page - Analog Devices |
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LTC6953 数据表(HTML) 46 Page - Analog Devices |
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46 / 56 page ![]() LTC6953 46 Rev 0 For more information www.analog.com Preliminary Technical Data Advance Product Information Subject to Change Rev PrA APPLICATIONS INFORMATION ADC CLOCKING AND JITTER REQUIREMENTS Adding noise directly to a clean signal clearly reduces its signal to noise ratio (SNR). In data acquisition applica- tions, digitizing a clean signal with a noisy clock signal also degrades the SNR. This issue is best explained in the time domain using jitter instead of phase noise. For this discussion, assume that the jitter is white (flat with frequency) and of Gaussian distribution. Figure 31 shows a sine wave signal entering a typical data acquisition circuit composed of an ADC, an input signal amplifier and a sampling clock. Also shown are three sig- nal sampling scenarios for sampling the sine wave at its zero crossing. In the first scenario, a perfect sine wave input is buffered by a noiseless amplifier to drive the ADC. Sampling is per- formed by a perfect, zero jitter clock. Without any added noise or sampling clock jitter, the ADC’s digitized output value is very clearly determined and perfectly repeatable from cycle to cycle. In the second scenario, a perfect sine wave input is buff- ered by a noisy amplifier to drive the ADC. Sampling is performed by a perfect, zero jitter clock. The added noise results in an uncertainty in the digitized value, causing an error term which degrades the SNR. The degraded SNR in this scenario, from adding noise to the signal, is expected. In the third scenario, a perfect sine wave input is buffered by a noiseless amplifier to drive the ADC. Sampling is performed by a clock signal with added jitter. Note that as the signal is slewing, the jitter of the clock signal leads to an uncertainty in the digitized value and an error term just as in the previous scenario. Again, this error term degrades the SNR. A real-world system will have both additive amplifier noise and sample clock jitter. Once the signal is digitized, deter- mining the root cause of any SNR degradation—amplifier noise or sampling clock jitter—is essentially impossible. Degradation of the SNR due to sample clock jitter only occurs if the analog input signal is slewing. If the analog input signal is stationary (DC) then it does not matter when in time the sampling occurs. Additionally, a faster slewing input signal yields a greater error (more noise) than a slower slewing input signal. Figure 30. PCB Top Metal Layer Pin and Exposed Ground Pad Design. Pin 41 is Signal Ground and Connected Directly to the Exposed Pad Metal 6953 F30 |
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