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LTC6953 数据表(PDF) 46 Page - Analog Devices

部件名 LTC6953
功能描述  Ultralow Jitter, 4.5GHz Clock Distributor with 11 Outputs and JESD204B Support
PDF  56 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

LTC6953 数据表(HTML) 46 Page - Analog Devices

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LTC6953
46
Rev 0
For more information www.analog.com
Preliminary Technical Data
Advance Product Information Subject to Change
Rev PrA
APPLICATIONS INFORMATION
ADC CLOCKING AND JITTER REQUIREMENTS
Adding noise directly to a clean signal clearly reduces its
signal to noise ratio (SNR). In data acquisition applica-
tions, digitizing a clean signal with a noisy clock signal
also degrades the SNR. This issue is best explained in
the time domain using jitter instead of phase noise. For
this discussion, assume that the jitter is white (flat with
frequency) and of Gaussian distribution.
Figure 31 shows a sine wave signal entering a typical data
acquisition circuit composed of an ADC, an input signal
amplifier and a sampling clock. Also shown are three sig-
nal sampling scenarios for sampling the sine wave at its
zero crossing.
In the first scenario, a perfect sine wave input is buffered
by a noiseless amplifier to drive the ADC. Sampling is per-
formed by a perfect, zero jitter clock. Without any added
noise or sampling clock jitter, the ADC’s digitized output
value is very clearly determined and perfectly repeatable
from cycle to cycle.
In the second scenario, a perfect sine wave input is buff-
ered by a noisy amplifier to drive the ADC. Sampling is
performed by a perfect, zero jitter clock. The added noise
results in an uncertainty in the digitized value, causing an
error term which degrades the SNR. The degraded SNR in
this scenario, from adding noise to the signal, is expected.
In the third scenario, a perfect sine wave input is buffered
by a noiseless amplifier to drive the ADC. Sampling is
performed by a clock signal with added jitter. Note that
as the signal is slewing, the jitter of the clock signal leads
to an uncertainty in the digitized value and an error term
just as in the previous scenario. Again, this error term
degrades the SNR.
A real-world system will have both additive amplifier noise
and sample clock jitter. Once the signal is digitized, deter-
mining the root cause of any SNR degradation—amplifier
noise or sampling clock jitter—is essentially impossible.
Degradation of the SNR due to sample clock jitter only
occurs if the analog input signal is slewing. If the analog
input signal is stationary (DC) then it does not matter
when in time the sampling occurs. Additionally, a faster
slewing input signal yields a greater error (more noise)
than a slower slewing input signal.
Figure 30. PCB Top Metal Layer Pin and Exposed Ground Pad Design. Pin 41 is Signal
Ground and Connected Directly to the Exposed Pad Metal
6953 F30



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