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HC705JB2GRS/H 数据表(PDF) 82 Page - NXP Semiconductors |
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HC705JB2GRS/H 数据表(HTML) 82 Page - NXP Semiconductors |
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82 / 128 page ![]() GENERAL RELEASE SPECIFICATION August 28, 1998 UNIVERSAL SERIAL BUS MODULE MC68HC705JB2 10-14 REV 1.1 10.4.3.2 Data Source Jitter The source of data can have some variation (jitter) in the timing of edges of the data transmitted. The time between any set of data transitions is N * TPERIOD ± jitter time, where ‘N’ is the number of bits between the transitions and TPERIOD is defined as the actual period of the data rate. The data jitter is measured with the same capacitive load used for maximum rise and fall times and is measured at the crossover points of the data lines as shown in Figure 10-14. Figure 10-14. Data Jitter For low speed transmissions, the jitter time for any consecutive differential data transitions must be within ±25 ns and within ±10 ns for any set of paired differential data transitions. These jitter numbers include timing variations due to differential buffer delay, rise/fall time mismatches, internal clock source jitter, and to noise and other random effects. 10.4.3.3 Data Signal Rise and Fall Time The output rise time and fall time are measured between 10% and 90% of the signal. Edge transition time for the rising and falling edges of low speed signals is 75 ns (minimum) into a capacitive load (CL) of 50 pF and 300 ns (maximum) into a capacitive load of 350 pF. The rising and falling edges should be smooth transitional (monotonic) when driving the cable to avoid excessive EMI. Figure 10-15. Data Signal Rise and Fall Time CONSECUTIVE TRANSITIONS tPeriod DIFFERENTIAL DATA LINES CROSSOVER POINTS PAIRED TRANSITIONS tR DIFFERENTIAL DATA LINES tF RISE TIME FALL TIME 10% 90% 90% 10% LOW SPEED: 75ns at CL = 50pF, 300ns at CL = 350pF CL CL Freescale Semiconductor, Inc. For More Information On This Product, Go to: www.freescale.com |
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