HC705JB2GRSSLASHH datasheet(121/128 Pages) NXP

121 / 128 page

August 28, 1998

GENERAL RELEASE SPECIFICATION

ELECTRICAL SPECIFICATIONS

REV 1.1

13-3

NOTES:

1. All values shown reflect average measurements.

2. Typical values at midpoint of voltage range, 25

°C only.

3. Wait IDD: Only timer system (MFT) active.

4. Run (Operating) IDD, Wait IDD: Measured using external square wave clock source to OSC1 (fOSC = 6.0 MHz), all inputs 0.2 VDC from

rail; no DC loads, less than 50pF on all outputs, CL = 20 pF on OSC2.

5. Wait, Stop IDD: All ports configured as inputs, VIL = 0.2 VDC, VIH = VDD-0.2 VDC.

6. Stop IDD measured with OSC1 = VSS.

7. Wait IDD is affected linearly by the OSC2 capacitance.

8. TA = 0°C to +40°C.

9. These are preliminary specifications.

13.4

USB DC ELECTRICAL CHARACTERISTICS

Table 13-4. USB DC Electrical Characteristics

(VDD = 4.2V to 5.5V, VSS = 0 Vdc, TA = 0°C to +70°C, unless otherwise noted)

Characteristic

Symbol

Conditions

Min

Typ

Max

Unit

Hi-Z State Data LIne Leakage

ILO

0V<Vin<3.3V

–10

+10

µA

Differential Input Sensitivity

VDI

|(D+)–(D–)|,

and Figure 12-1

0.2

Differential Common Mode

Range

VCM

Includes VDI

range

0.8

2.5

Single Ended Receiver

Threshold

VSE

0.8

2.0

Static Output Low

VOL

RL of 1.5k to

3.6V

0.3

Static Output High

VOH

RL of 15k to

GND

2.8

3.6

3.3V External Reference Pin

V3.3

IL=200µA

3.0

3.3

3.6

Freescale Semiconductor, Inc.

For More Information On This Product,

Go to: www.freescale.com

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