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HC705JJ7GRS/D 数据表(PDF) 104 Page - NXP Semiconductors |
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HC705JJ7GRS/D 数据表(HTML) 104 Page - NXP Semiconductors |
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104 / 230 page ![]() Analog Subsystem General Release Specification MC68HC705JJ7/MC68HC705JP7 — Rev. 3.0 Analog Subsystem 8.2 Introduction The analog subsystem of the MC68HC705JJ7/MC68HC705JP7 is based on two on-chip voltage comparators and a selectable current charge/discharge function as shown in Figure 8-1. This configuration provides several features: • Two (2) independent voltage comparators with external access to both inverting and non-inverting inputs • One voltage comparator can be connected as a single-slope A/D and the other connected as a single-voltage comparator. The possible single-slope A/D connection provides the following features: – A/D conversions can use VDD or an external voltage as a reference with software used to calculate ratiometric or absolute results – Channel access of up to four inputs via multiplexer control with independent multiplexer control allowing mixed input connections – Access to VDD and VSS for calibration – Divide by 2 to extend input voltage range – Each comparator can be inverted to calculate input offsets – Internal sample and hold capacitor – direct digital output of comparator 1 to the PB4 pin Voltages are resolved by measuring the time it takes an external capacitor to charge up to the level of the unknown input voltage being measured. The beginning of the A/D conversion time can be started by several means: • Output compare from the 16-bit programmable timer • Timer overflow from the 16-bit programmable timer • Direct software control via a register bit The end of the A/D conversion time can be captured by these means: • Input capture in the 16-bit programmable timer • Interrupt generated by the comparator output • Software polling of the comparator output using software loop time Freescale Semiconductor, Inc. For More Information On This Product, Go to: www.freescale.com |
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